Atomic Force Microscope (Bruker ICON) - Revision history

John d: linked to high-aspect-ratio trench schematic

2026-06-16T19:56:13Z

linked to high-aspect-ratio trench schematic

← Older revision		Revision as of 19:56, 16 June 2026
Line 30:		Line 30:
	=See Also=		=See Also=
	*[https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html Bruker ICON AFM overview]		*[https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html Bruker ICON AFM overview]
			*[https://docs.google.com/drawings/d/1WLvuu-BD0pzroAbuUE52mt5bO5VWN3biWDdG27dM86o/edit?usp=sharing Limitations on measuring high-aspect ratio trenches] - what happens when your trench is too deep for the probe tip? You mostly measure the tip's shape!

Silva at 18:57, 30 August 2022

2022-08-30T18:57:59Z

← Older revision		Revision as of 18:57, 30 August 2022
Line 1:		Line 1:
	{{~~tool~~\|{{PAGENAME}}		{{tool2\|{{PAGENAME}}
	\|picture=ICON_AFM.jpg		\|picture=ICON_AFM.jpg
	\|type = Inspection, Test and Characterization		\|type = Inspection, Test and Characterization
	\|super= ~~Bill~~ ~~Mitchell~~		\|super= Aidan Hopkins
			\|super2= Bill Mitchell
	\|phone= (805)893-4974		\|phone= (805)893-4974
	\|location=Bay 5		\|location=Bay 5

Mitchell: Mitchell moved page Atomic Force Microscope (Dimension 3100/Nanoscope IVA) to Atomic Force Microscope (Bruker ICON)

2018-11-30T18:11:00Z

Mitchell moved page Atomic Force Microscope (Dimension 3100/Nanoscope IVA) to Atomic Force Microscope (Bruker ICON)

← Older revision	Revision as of 18:11, 30 November 2018
(No difference)

Mitchell: /* About */

2018-11-30T18:07:46Z

About

← Older revision		Revision as of 18:07, 30 November 2018
Line 16:		Line 16:
	Note that the ICON AFM also can also utilize the legacy ContactMode and TappingMode techniques for imaging if required.		Note that the ICON AFM also can also utilize the legacy ContactMode and TappingMode techniques for imaging if required.

	In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to pN range, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (1-10 nN range). PeakForce Tapping® enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.		In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to pN range, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™, in the 1-10 nN range. PeakForce Tapping® enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.

	=Detailed Specifications=		=Detailed Specifications=

Mitchell at 18:04, 30 November 2018

2018-11-30T18:04:08Z

← Older revision		Revision as of 18:04, 30 November 2018
Line 16:		Line 16:
	Note that the ICON AFM also can also utilize the legacy ContactMode and TappingMode techniques for imaging if required.		Note that the ICON AFM also can also utilize the legacy ContactMode and TappingMode techniques for imaging if required.

	In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping® enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.		In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to pN range, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (1-10 nN range). PeakForce Tapping® enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.

	=Detailed Specifications=		=Detailed Specifications=

Mitchell: /* About */

2018-11-30T17:55:02Z

About

← Older revision		Revision as of 17:55, 30 November 2018
Line 14:		Line 14:
	The Bruker ICON AFM utilizes the latest paradigm in Atomic Force Microscopy - '''PeakForce Tapping®,''' a method that combines the best features of the legacy Contact Mode and Tapping Mode imaging techniques, namely direct force control and intermittent surface contact to reduce damaging lateral forces, to precisely control the probe-to-surface force interaction as pixel-to-pixel force curve measurements. This control results in the most consistent, highest resolution AFM imaging technique that can be used on a wide range of sample types.		The Bruker ICON AFM utilizes the latest paradigm in Atomic Force Microscopy - '''PeakForce Tapping®,''' a method that combines the best features of the legacy Contact Mode and Tapping Mode imaging techniques, namely direct force control and intermittent surface contact to reduce damaging lateral forces, to precisely control the probe-to-surface force interaction as pixel-to-pixel force curve measurements. This control results in the most consistent, highest resolution AFM imaging technique that can be used on a wide range of sample types.

	Note that the ICON AFM also can also utilize the legacy ~~Contact Mode~~ and ~~Tapping Mode~~ techniques for imaging if required.		Note that the ICON AFM also can also utilize the legacy ContactMode and TappingMode techniques for imaging if required.

	In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.		In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping® enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.

	=Detailed Specifications=		=Detailed Specifications=

Mitchell at 17:22, 30 November 2018

2018-11-30T17:22:26Z

← Older revision		Revision as of 17:22, 30 November 2018
Line 16:		Line 16:
	Note that the ICON AFM also can also utilize the legacy Contact Mode and Tapping Mode techniques for imaging if required.		Note that the ICON AFM also can also utilize the legacy Contact Mode and Tapping Mode techniques for imaging if required.

	In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. ~~This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials.~~		In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces.

	=Detailed Specifications=		=Detailed Specifications=

Mitchell at 21:50, 29 November 2018

2018-11-29T21:50:36Z

← Older revision		Revision as of 21:50, 29 November 2018
Line 1:		Line 1:
	{{tool\|{{PAGENAME}}		{{tool\|{{PAGENAME}}
	\|picture=~~VeecoNanoman~~.jpg		\|picture=ICON_AFM.jpg
	\|type = Inspection, Test and Characterization		\|type = Inspection, Test and Characterization
	\|super= Bill Mitchell		\|super= Bill Mitchell

Mitchell at 21:49, 29 November 2018

2018-11-29T21:49:01Z

← Older revision		Revision as of 21:49, 29 November 2018
Line 6:		Line 6:
	\|location=Bay 5		\|location=Bay 5
	\|email=mitchell@ece.ucsb.edu		\|email=mitchell@ece.ucsb.edu
	\|description = ~~Dimension~~ ~~3100~~ ~~Nanoman~~		\|description = Bruker ICON AFM
	\|manufacturer = ~~Veeco~~ ~~Metrology~~, ~~LLC~~		\|manufacturer = Bruker Nano, Inc
	\|materials =		\|materials =
	\|toolid= 1		\|toolid= 1

Mitchell at 21:47, 29 November 2018

2018-11-29T21:47:37Z

← Older revision		Revision as of 21:47, 29 November 2018
Line 4:		Line 4:
	\|super= Bill Mitchell		\|super= Bill Mitchell
	\|phone= (805)893-4974		\|phone= (805)893-4974
	\|location=Bay 7		\|location=Bay 5
	\|email=mitchell@ece.ucsb.edu		\|email=mitchell@ece.ucsb.edu
	\|description = Dimension 3100 Nanoman		\|description = Dimension 3100 Nanoman