Wafer Scanning process Traveler - Revision history

Biljana: wafers scanning procedure

2020-04-22T18:31:39Z

wafers scanning procedure

← Older revision		Revision as of 18:31, 22 April 2020
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	# Log out.		# Log out.

	=== Scan ~~before~~ process calibration ===		=== Scan after process calibration ===
			Repeat the same procedure as it was done before process calibration.
	* Log in (access code is boss)
	* Load wafers (face up) to the cassette that says " SURFSCAN" .
	* Place the cassette with wafers to the right indexer.
	* In the menu option select "CAS" (this will read all wafers that are in the carrier).
	* Go to "Recipes"
	* Select one of the recipes:
	** UCSB Gain4 (measuring small particles 0.16-1.6um)
	** UCSB Gain2 (measuring larger particles 1.6-28um)
	*** (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
	* View the recipe and modify it if needed ( if recipe modified, select bin split/default to save changes).
	* Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers-AUTO option).
	* Select START.
	* Wait until scan is finished.
	* Record:
	** '''LPD Cnt''' (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um
	** '''Haze''' (region(%), average(ppm), peak(ppm)).
	* Take a picture of the scan (by phone).
	* Select "Home" so indexer moves up to loading/unloading position.
	* Unload wafers.
	* Log out.

Biljana: /* Wafers to Use */

2020-04-22T18:25:44Z

Wafers to Use

← Older revision		Revision as of 18:25, 22 April 2020
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	== Wafers to Use ==		== Wafers to Use ==
			The wafers for process calibration are ordered from a wafer supplier that sells high grade, quality wafers. these are 4"Si wafers, with low particle count (Particles: <=10 @ >=0.3 microns). Wafers should be handled carefully, because every loading and unloading will add some particulates.
	The wafers for process calibration are ordered from SVM (<nowiki>https://www.svmi.com/</nowiki>). Specification:
	* Silicon Wafer
	* Diameter: 100mm
	* Type/Dopant: P/Boron
	* Orientation: <100>
	* Resistivity: 1-30 ohm-cm
	* Thickness: 525 +/-25 microns
	* Polished/Etched
	* Particles: <=10 @ >=0.3 microns
	These wafers have low LPD count (LPD= light particle detection, LPD<100).

		⚫	Surfscan 6200 (located in bay5) is used for scanning wafers. There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). The recipe UCSBTEST2 is used as a template to create other two standard recipes: "UCSB Gain4" (measuring small particles 0.16-1.6um) and "UCSB Gain2" (measuring larger particles 1.6-28um).
	The box with 25 wafers is stored in the cleanroom and staff use it only for process calibration (you can order same type of wafers for the same purpose). Wafers are handled very carefully, because every loading and unloading of wafers will add some particulates.

		⚫	We have cassettes only for 4" and 8" wafers. If you plan to scan wafers that have different size, you need to provide your own cassette and calibrate it. If you need to scan wafer pieces, you need to develop your own procedure how to scan it.
⚫	Surfscan 6200 (located in bay5) is used for scanning wafers. There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). The recipe UCSBTEST2 is used as a template to create other two standard recipes: "UCSB Gain4" (measuring small particles 0.16-1.6um) and "UCSB Gain2" (measuring larger particles 1.6-28um).

⚫	We ~~do not~~ have cassettes for ~~any~~ ~~other~~ ~~size~~ of ~~the~~ wafers. ~~You~~ need to provide your own cassette and calibrate it. If you need to scan ~~wafers~~ pieces, you need to develop your own procedure how to scan it.

	== Scanning procedure for 4" Si wafers ==		== Scanning procedure for 4" Si wafers ==

Biljana: scanning wafers

2020-04-20T16:36:16Z

scanning wafers

@@ Line 1: / Line 1: @@
 == Wafers to Use ==
 The wafers for process calibration are ordered from SVM (<nowiki>https://www.svmi.com/</nowiki>). Specification:
 These wafers have low LPD count (LPD= light particle detection, LPD<100).
 The box with 25 wafers is stored in the cleanroom and staff use it only for process calibration (you can order same type of wafers for the same purpose). Wafers are handled very carefully, because every loading and unloading of wafers will add some particulates.
-Surfscan 6200 (located in bay5) is used for scanning wafers.  There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). We do not have cassettes for any other size of the wafers. You need to provide your own cassette and calibrate it. If you need to scan wafers pieces, you need to develop your own procedure how to scan it.
+Surfscan 6200 (located in bay5) is used for scanning wafers.  There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). The recipe UCSBTEST2 is used as a template to create other two standard recipes:  "UCSB Gain4" (measuring small particles 0.16-1.6um) and "UCSB Gain2" (measuring larger particles 1.6-28um).
 == Scanning procedure for 4" Si wafers ==
@@ Line 28: / Line 21: @@
 === Scan before process calibration ===
 # Log in (access code is boss)
-# Load wafers(face up) to the carrier that says " SURFSCAN" .
+# Load wafers (face up) to the cassette that says " SURFSCAN" .
-# Place the carrier with wafers to the right indexer.
+# Place the cassette with wafers to the right indexer.
 # In the menu option select "CAS" (this will read all wafers that are in the carrier).
 # Go to "Recipes"
@@ Line 36: / Line 29: @@
 #* UCSB Gain2 (measuring larger particles 1.6-28um)
 #** (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
-# View the recipe and modify it if needed ( if recipe modified, select bin split/default).
+# View the recipe and modify it if needed ( if recipe modified, select bin split/default to save changes).
-# Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers).
+# Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers-AUTO option).
 # Select START.
 # Wait until scan is finished.
-# Record: LPD Cnt (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um, haze region(%).
+#* '''LPD Cnt''' (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um
 # Take a picture of the scan (by phone).
 # Select "Home" so indexer moves up to loading/unloading position.
 # Unload wafers.
 # Log out.

Biljana: Scanning wafers

2020-04-20T16:20:39Z

Scanning wafers

New page

== Wafers to Use ==
The wafers for process calibration are ordered from SVM (<nowiki>https://www.svmi.com/</nowiki>). Specification:

Silicon Wafer

Diameter: 100mm

Type/Dopant: P/Boron

Orientation: <100>

Resistivity: 1-30 ohm-cm

Thickness: 525 +/-25 microns

Polished/Etched

Particles: <=10 @ >=0.3 microns

These wafers have low LPD count (LPD= light particle detection, LPD<100).

The box with 25 wafers is stored in the cleanroom and staff use it only for process calibration (you can order same type of wafers for the same purpose). Wafers are handled very carefully, because every loading and unloading of wafers will add some particulates.

Surfscan 6200 (located in bay5) is used for scanning wafers. There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). We do not have cassettes for any other size of the wafers. You need to provide your own cassette and calibrate it. If you need to scan wafers pieces, you need to develop your own procedure how to scan it.

== Scanning procedure for 4" Si wafers ==

=== Scan before process calibration ===
# Log in (access code is boss)
# Load wafers(face up) to the carrier that says " SURFSCAN" .
# Place the carrier with wafers to the right indexer.
# In the menu option select "CAS" (this will read all wafers that are in the carrier).
# Go to "Recipes"
# Select one of the recipes:
#* UCSB Gain4 (measuring small particles 0.16-1.6um)
#* UCSB Gain2 (measuring larger particles 1.6-28um)
#** (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
# View the recipe and modify it if needed ( if recipe modified, select bin split/default).
# Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers).
# Select START.
# Wait until scan is finished.
# Record: LPD Cnt (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um, haze region(%).
# Take a picture of the scan (by phone).
# Select "Home" so indexer moves up to loading/unloading position.
# Unload wafers.
# Log out.