Photoresist Spin Coat Benches: Difference between revisions

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(Created page with "{{tool|{{PAGENAME}} |picture=SolventBench.jpg |type = Wet Processing |super= Aidan Hopkins |phone=(805)839-3918x208 |location=? |email=hopkins@ece.ucsb.edu |description = Custom …")
 
(Redirected page to Wet Benches#Spin Coat Benches)
 
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#redirect [[Wet Benches#Spin Coat Benches]]
{{tool|{{PAGENAME}}
|picture=SolventBench.jpg
|type = Wet Processing
|super= Aidan Hopkins
|phone=(805)839-3918x208
|location=?
|email=hopkins@ece.ucsb.edu
|description = Custom Photoresist Spin Coat Bench
|manufacturer = Pure Aire Corporation
|materials =
}}

= About =

The facility contains 3 stainless steel solvent benches for photoresist spin coating. The benches consist each of 2 integrated Headway PWM32 series photoresist spinners. Overhead and foot controls are provided. 8 preprogrammed recipes and 2 user-programmable recipes are offered. Automatic wafer lifting and centering stations are offered for spinning large wafers up to 8” in diameter. 6” or 8” Cee ultra-flat hotplates with 0.1°C temperature stability are preset for standard resist bake temperatures (90, 95, 100, 105, 110, 115°C). Other user-changeable hot plates are also provided. Nitrogen guns are also on both sides of the bench. Large resist bottles are stored in a refrigerator amd small user bottles are stored by group in a ventilated steel cabinet. Waste pipets and resist soaked wipes are collected for disposal. A list of stocked resists appears on the lithography processing web page. Other chemicals should be OK'd by laboratory staff prior to use in the laboratory.

= Deatailed Specifications =

*2 Headway PWM32 spinners per bench, multi-step programming
*8 preset spin programs, 2 user defineable
*Variety of wafer chucks for 5 mm x 5 mm pieces to 6” wafers
*Lifters for large wafer centering
*Preset 0.1°C stable, ultra-flat hotplates (90, 95, 1100, 105, 110, 115°C)
*'''NO WAX''' on hotplates
*Other hotplates for user defined temperatures
*Hepa filtered laminar flow for Class 100
*Manual dispense of resist; particle filtering available

Latest revision as of 14:42, 12 July 2012