InP Etch Rate and Selectivity (InP/SiO2): Difference between revisions
Jump to navigation
Jump to search
(add a SEM) |
(add data) |
||
Line 164: | Line 164: | ||
|11.4 |
|11.4 |
||
|[https://www.nanotech.ucsb.edu/wiki/images/8/84/IP180909.pdf] |
|[https://www.nanotech.ucsb.edu/wiki/images/8/84/IP180909.pdf] |
||
|- |
|||
|1/31/2019 |
|||
|InP#1901 |
|||
|0.88 |
|||
|9.7 |
|||
| |
|||
|} |
|} |
Revision as of 17:32, 1 February 2019
1.4 mT, 125/800W, Cl2/H2/Ar flow-rate=6.3/12.7/2 sccm, chuck temperature=200 C, and etch time=90s (Prior to the etch, do O2 plasma chamber clean for 15 minutes, then, chamber coating with the same recipe and a quarter dummy InP on carrier for 15 minutes. | ||||
Date | Sample# | InP Etch Rate (um/min) | Selectivity (InP/SiO2) | Profile SEM Picture |
10/4/2016 | InP#1613 | 0.92 | 8.9 | |
12/1/2016 | InP#1614 | 0.96 | 12.1 | |
12/15/2016 | InP#1615 | 0.91 | 9.3 | |
1/23/2017 | InP#1701 | 0.93 | 9.4 | |
2/7/2017 | InP#1702 | 0.75 | 7.7 | |
2/21/2017 | InP#1703 | 0.91 | 11.3 | |
3/21/2017 | InP#1704 | 1.01 | 11.3 | |
4/20/2017 | inP#1705 | 0.88 | 10.2 | |
5/4/2017 | InP#1706 | 0.84 | 11 | |
5/19/2017 | InP#1707 | 0.82 | 9.9 | |
7/6/2017 | InP#1708 | 0.98 | 12.1 | |
8/16/2017 | InP#1709 | 0.76 | 8 | |
8/28/2017 | InP#1710 | 1 | 11.7 | |
10/11/2017 | InP#1711 | 1 | 11 | |
10/23/2017 | InP#1712 | 1.11 | 13.1 | |
11/21/2017 | InP#1713 | 1.04 | 12.1 | |
12/7/2017 | InP#1714 | 0.96 | 10.4 | |
1/2/2018 | InP#1801 | 1.44 | 14.3 | [1] |
3/1/2018 | InP#1802 | 0.96 | 9 | [2] |
4/5/2018 | InP#1803 | 1.05 | 11.9 | [3] |
4/10/2018 | InP#1804 | 1.12 | 12.8 | [4] |
4/26/2018 | InP#1805 | 1.29 | 13.6 | [5] |
5/22/2018 | InP#1806 | 0.88 | 8.4 | [6] |
8/7/2018 | InP#1807 | 0.81 | 8.0 | [7] |
10/3/2018 | InP#1808 | 1.01 | 13.7 | [8] |
12/10/2018 | InP#1809 | 1.01 | 11.4 | [9] |
1/31/2019 | InP#1901 | 0.88 | 9.7 |