InP Etch Rate and Selectivity (InP/SiO2): Difference between revisions

From UCSB Nanofab Wiki
Jump to navigation Jump to search
(add SEM)
(add SEM)
Line 97: Line 97:
|1.11
|1.11
|13.1
|13.1
|[https://www.nanotech.ucsb.edu/wiki/images/4/41/IP173107.pdf]
|
|-
|-
|11/21/2017
|11/21/2017

Revision as of 23:22, 1 February 2019

1.4 mT, 125/800W, Cl2/H2/Ar flow-rate=6.3/12.7/2 sccm, chuck temperature=200 C, and etch time=90s (Prior to the etch, do O2 plasma chamber clean for 15 minutes, then, chamber coating with the same recipe and a quarter dummy InP on carrier for 15 minutes.
Date  Sample# InP Etch Rate (um/min) Selectivity (InP/SiO2) Profile SEM Picture
10/4/2016 InP#1613 0.92 8.9
12/1/2016 InP#1614 0.96 12.1
12/15/2016 InP#1615 0.91 9.3
1/23/2017 InP#1701 0.93 9.4 [1]
2/7/2017 InP#1702 0.75 7.7 [2]
2/21/2017 InP#1703 0.91 11.3 [3]
3/21/2017 InP#1704 1.01 11.3 [4]
4/20/2017 inP#1705 0.88 10.2 [5]
5/4/2017 InP#1706 0.84 11 [6]
5/19/2017 InP#1707 0.82 9.9 [7]
7/6/2017 InP#1708 0.98 12.1 [8]
8/16/2017 InP#1709 0.76 8 [9]
8/28/2017 InP#1710 1 11.7 [10]
10/11/2017 InP#1711 1 11 [11]
10/23/2017 InP#1712 1.11 13.1 [12]
11/21/2017 InP#1713 1.04 12.1
12/7/2017 InP#1714 0.96 10.4
1/2/2018 InP#1801 1.44 14.3 [13]
3/1/2018 InP#1802 0.96 9 [14]
4/5/2018 InP#1803 1.05 11.9 [15]
4/10/2018 InP#1804 1.12 12.8 [16]
4/26/2018 InP#1805 1.29 13.6 [17]
5/22/2018 InP#1806 0.88 8.4 [18]
8/7/2018 InP#1807 0.81 8.0 [19]
10/3/2018 InP#1808 1.01 13.7 [20]
12/10/2018 InP#1809 1.01 11.4 [21]
1/31/2019 InP#1901 0.88 9.7 [22][23]