ICP-PECVD (Unaxis VLR): Difference between revisions
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*1000W ICP source, 600W RF Sample Bias Power Supply |
*1000W ICP source, 600W RF Sample Bias Power Supply |
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*100 - 350°C sample temperature |
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*100% |
*100% SiD<sub>4</sub>, Ar, N<sub>2</sub>, O<sub>2</sub> |
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*Multiple 4” diameter wafer capable system |
*Multiple 4” diameter wafer capable system |
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*Pieces possible by mounting or placing on 4 ” wafer |
*Pieces possible by mounting or placing on 4 ” wafer |
Revision as of 15:57, 20 April 2020
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About
This system is configured as an ICP PECVD deposition tool with 1000 W ICP power, 600 W RF substrate power, and 100°C-350°C operation. This chamber has 100% SiD4, N2, O2, and Ar for gas sources. The high density PECVD produces a more dense, higher quality SiO2 and Si3N4, as compared with conventional PECVD. With the high density plasma, deposition of high quality films can be deposited as low as 100°C for processes requiring lower temperatures. Stress compensation for silicon nitride is characterized.
Cluster Configuration
A Deposition and Etch chamber are both attached to the same loadlock, allowing etching and deposition without breaking vacuum. Each chamber can be scheduled separately on SignupMonkey.
- PM3: ICP-PECVD Deposition (this page)
- PM1: ICP Etch (Unaxis VLR)
Detailed Specifications
- 1000W ICP source, 600W RF Sample Bias Power Supply
- 100 - 350°C sample temperature
- 100% SiD4, Ar, N2, O2
- Multiple 4” diameter wafer capable system
- Pieces possible by mounting or placing on 4 ” wafer
Documentation
- Operating Instructions
- Wafer Coating Process Traveler
- Wafer Scanning process Traveler
Recipes
You can find recipes for this tool on the Wiki > Recipes > PECVD Recipes page