E-Beam 1 (Sharon)
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About
This electron-beam evaporation system is used for the controlled deposition of thin dielectric films. The films are evaporated from a wide variety of solid sources. The most common dielectrics deposited are: SiO2, SiO, TiO2, Ta2O5, SrF2. Other materials may be evaporated upon request. Oxygen gas can be bled into the system during deposition to try to maintain the stoichiometry during deposition. Fixturing for heating the substrate can also be used. A crystal thickness monitor is used to control the deposition thickness. The dielectrics deposited by this system are typically used for optical coatings (anti-reflective and highly reflective multiple layer stacks), electrical insulators, and reactive ion etching masks. Samples up to ~ 3” x 3” can be placed into this system for evaporation. Typical deposition rates are several Angstroms/second.
Processes
This section will outline the basic processes that run on the tool.
Process #1
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Process #2
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Materials Table
Material | Position | Hearth / Crucible | Film Number | Density | Z Ratio | Tooling | Comments |
---|---|---|---|---|---|---|---|
Ag | 4 | C | 5 | 10.5 | 0.524 | 140 | |
Al | 2 | C | 6 | 2.7 | 1.080 | 118 | |
Al2O3 | 1 | C | 6 | 3.97 | 0.50 | 169 | |
Au | 4 | C | 4 | 19.3 | 0.381 | 138 | Bazookas can be used at 20-30Å/sec. |
AuGe | 3 | C | 5 | 17.63 | 0.397 | 151 | Composition unpredictable unless you practically empty the crucible. |
Cr | 3 | H | 6 | 7.2 | 0.305 | 140 | Do not evaporate more than 200Å of Cr in the E-Beam evaporator. |
Fe | 7.86 | 0.349 | |||||
Ge | 3 | C | 6 | 5.35 | 0.516 | 130 | |
MgO | 1 | 6 | |||||
Mo | 10.2 | 0.257 | |||||
Ni | 1 | H | 1 | 8.91 | 0.331 | 140 | Prone to spitting. Cool down for 15 minutes before venting. |
NiCr | 1 | H | 6 | 8.23 | 0.321 | ||
Nb | 4 | C | 6 | 8.57 | 0.516 | Cool down for at least 35 minutes before venting. | |
Pd | 1 | H | 9 | 12.0 | 0.357 | 140 | |
Pt | 1 | C | 8 | 21.40 | 0.245 | 140 | Prone to spitting. Evaporate at 1.5Å/sec or less. |
Si | 2 | H | 2 | 2.32 | 0.712 | 150 | Cool down very slowly after evaporating lest you crack the source. |
SiO | C | 6 | 2.13 | 0.87 | 132 | ||
SiO2 | 1 | C | 6 | 2.2 | 1.07 | 140 | Please change the crystal and the upper mirror after evaporating oxide. |
SrF | 1 | C | 6 | 4.28 | 0.727 | 140 | |
Ta | 1 | H | 6 | 16.6 | 0.262 | Requires extremely high current. Minimum 35 minute cool down. Hearth #3 may be used. Call me before you try Ta. | |
W | 1 | C | 6 | 19.3 | 0.163 | 138 | |
Ti | 3 | H | 3 | 4.50 | 0.628 | 139 |
Detailed Specifications
Details about the tool
- Cryopump: CTI Cryotorr 8F with air-cooled compressor
- Pumping speed: 4,000 l/sec. for H2O, 1,500 l/sec. for air, 2,200 l/sec. for H2, 200 l/sec. for Ar
- Mechanical Pump: Varian, Model SD700, 35 CFM
- Electron Beam Source: Temescal, Model STIH-270-2MB, four 15 cc hearths
- Electron Beam Power Supply: Temescal, Model CV8A-111, -5 to -10 kV dc, 0.8A dc max. beam current; XYS-8 Sweep Control
- Deposition Control: Inficon IC 6000, 6 film programs; 37 parameters for automatic or manual deposition control based on a resonating quartz crystal sensor
- Ion Source: Commonwealth Scientific Corp., MOD. 2. Kaufman-type, 3cm ion source; beam currents to 100mA at 1000eV
See Also
Links to documents pertaining to the tool...