Inspection, Test and Characterization: Difference between revisions
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(Created page with "Currently the Nanofab has the following '''{{PAGENAME}}''' tools. Please click on the tool for more information. * Field Emission SEM 1 * Field Emission SEM 2 * [[Step P…") |
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Currently the Nanofab has the following '''{{PAGENAME}}''' tools. Please click on the tool for more information. |
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* [[Field Emission SEM 1]] |
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* [[Field Emission SEM 2]] |
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* [[Step Profile]] |
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* [[Step Profilometer]] |
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* [[Ellipsometer]] |
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* [[Microscopes]] |
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* [[Probe Station & Curve Tracer]] |
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* [[Optical Film Thickness (Filmetrics)]] |
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* [[Scanning Probe Microscope]] |
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* [[Tencor Flexus Film Stress]] |
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* [[Optical Film Thickness (Nanometric)]] |
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* [[SEM Sample Coater]] |
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* [[Surface Analysis]] |
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* [[Photo-emission & IR Microscope]] |
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* [[Ellipsometer (Woollam)]] |
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* [[Goniometer]] |
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* [[4-Point Probe Resistivity Mapper]] |
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Latest revision as of 01:01, 28 June 2012
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