Vacuum Deposition Recipes: Difference between revisions
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= E-Beam Evaporation = |
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= Recipes = |
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== Recipe 1 == |
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=== Recipe 1 === |
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#Step 1 .... |
#Step 1 .... |
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#Step 2... |
#Step 2... |
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== Recipe 2 == |
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= Sputtering = |
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= Thermal Evaporation = |
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= |
=Plasma Enhanced Chemical Vapor Deposition (PECVD) = |
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== SiN deposition (PECVD #1) == |
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#'''Clean''' (30CLN_SN) |
#'''Clean''' (30CLN_SN) |
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##loop |
##loop |
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== SiO<sub>2</sub> deposition (PECVD #2) == |
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#'''Standard clean''' |
#'''Standard clean''' |
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##'''Pump down''': stabilization time t=15", step time(m)=0', step time(s)=30" |
##'''Pump down''': stabilization time t=15", step time(m)=0', step time(s)=30" |
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##process pressure=800, RF setpoint=30, stabilization time=15, step time(m)=10, step time(s)=0, 2%SiH4%He(1)=600, N2O(4)=1420 |
##process pressure=800, RF setpoint=30, stabilization time=15, step time(m)=10, step time(s)=0, 2%SiH4%He(1)=600, N2O(4)=1420 |
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= Atomic Layer Deposition (ALD) = |
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= Ion-Beam Deposition (IBD) = |
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= Molecular Vapor Deposition (MVD) = |
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Revision as of 20:24, 9 July 2012
This table can be used to help located the needed recipe.
Vacuum Deposition Recipes
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|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| E-Beam Evaporation | Sputtering | Thermal Evaporation | Plasma Enhanced Chemical Vapor Deposition (PECVD) |
Atomic Layer Deposition | Ion-Beam Deposition (IBD) | Molecular Vapor Deposition | |||||||||||
| Material | E-Beam 1 (Sharon) | E-Beam 2 (Custom) | E-Beam 3 (Temescal) | E-Beam 4 (CHA) | Sputter 1 (Custom) | Sputter 2 (SFI Endeavor) |
Sputter 3 (ATC 2000-F) |
Sputter 4 (ATC 2200-V) |
Sputter 5 (Lesker AXXIS) | Thermal 1 | Thermal 2 | PECVD 1 (PlasmaTherm 790) |
PECVD 2 (Advanced Vacuum) |
Unaxis VLR ICP-PECVD | |||
| Ag | Y | ||||||||||||||||
| Al | |||||||||||||||||
| Al2O3 | |||||||||||||||||
| AlN | |||||||||||||||||
| Au | |||||||||||||||||
| B | |||||||||||||||||
| Co | |||||||||||||||||
| Cr | |||||||||||||||||
| Cu | |||||||||||||||||
| Fe | |||||||||||||||||
| Ge | |||||||||||||||||
| Hf | |||||||||||||||||
| HfO2 | |||||||||||||||||
| In | |||||||||||||||||
| Ir | |||||||||||||||||
| ITO | |||||||||||||||||
| Mo | |||||||||||||||||
| Bn | |||||||||||||||||
| Ni | |||||||||||||||||
| Pd | |||||||||||||||||
| Pt | |||||||||||||||||
| Ru | |||||||||||||||||
| Si | |||||||||||||||||
| SiN | Y | ||||||||||||||||
| SiO2 | |||||||||||||||||
| SiOxNy | |||||||||||||||||
| Sn | |||||||||||||||||
| SrF2 | |||||||||||||||||
| Ta | |||||||||||||||||
| Ta2O5 | |||||||||||||||||
| Ti | |||||||||||||||||
| TiN | |||||||||||||||||
| TiO2 | |||||||||||||||||
| V | |||||||||||||||||
| W | |||||||||||||||||
| Zn | |||||||||||||||||
| ZnO2 | |||||||||||||||||
| Zr | |||||||||||||||||
| ZrO2 | |||||||||||||||||
E-Beam Evaporation
Recipe 1
- Step 1 ....
- Step 2...
Recipe 2
Sputtering
Thermal Evaporation
Plasma Enhanced Chemical Vapor Deposition (PECVD)
SiN deposition (PECVD #1)
- Clean (30CLN_SN)
- Initial t=10", p=2x10-2, T=250C
- N2 Purge t=30", p=300mT
- evacuate, base pressure=2x10-2, t=10"
- loop
- gas stabilization, t=30"
- etch chamber, t=30'
- evacuate, t=10"
- N2 purge
- evacuate
- loop
- SiN gas stabilization
- SiN deposition( 200A coat)
- evacuate
- N2purge, t=30"
- end
- SiN deposition (SiN_10) 130.8 A/min
- Initial t=10"
- N2 purge t=30"
- evacuate, t=10"
- loop
- SiN gas stabilization, t=30"
- SiN deposition t=8'11.2"
- evacuate, t=10"
- N2 purge t=30"
- evacuate t=10"
- loop
SiO2 deposition (PECVD #2)
- Standard clean
- Pump down: stabilization time t=15", step time(m)=0', step time(s)=30"
- Pre-purge: purge=1, stabilization time=15, step time(m)=1, step time(sec)=0
- High Pressure: process pressure=600, RF point=300, stabilization time=35, step time(m)=30, step time(s)=0, CF4/O2(5)=500
- Low pressure: process pressure=300, RF setpoint=300, stabilization time=15, step time(m)=30, step time(s)=0, CF4/O2(5)=500
- Oxide(HF, n=1.46, 25nm/min)
- process pressure=800, RF setpoint=30, stabilization time=15, step time(m)=10, step time(s)=0, 2%SiH4%He(1)=600, N2O(4)=1420