Difference between revisions of "Atomic Force Microscope (Bruker ICON)"

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|location=Bay 5
|location=Bay 5
|description = Dimension 3100 Nanoman
|description = Bruker ICON AFM
|manufacturer = Veeco Metrology, LLC
|manufacturer = Bruker Nano, Inc
|materials =
|materials =
|toolid= 1
|toolid= 1

Revision as of 13:49, 29 November 2018

Atomic Force Microscope (Bruker ICON)
Tool Type Inspection, Test and Characterization
Location Bay 5
Supervisor Bill Mitchell
Supervisor Phone (805) 893-4974
Supervisor E-Mail mitchell@ece.ucsb.edu
Description Bruker ICON AFM
Manufacturer Bruker Nano, Inc
Sign up for this tool


The Bruker ICON AFM utilizes the latest paradigm in Atomic Force Microscopy - PeakForce Tapping®, a method that combines the best features of the legacy Contact Mode and Tapping Mode imaging techniques, namely direct force control and intermittent surface contact to reduce damaging lateral forces, to precisely control the probe-to-surface force interaction as pixel-to-pixel force curve measurements. This control results in the most consistent, highest resolution AFM imaging technique that can be used on a wide range of sample types.

Note that the ICON AFM also can also utilize the legacy Contact Mode and Tapping Mode techniques for imaging if required.

In PeakForce Tapping®, the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. Through superior force control, the feedback loop keeps the peak force constant, down to 10 pN, in both air and fluid, which is significantly lower than is typically used with other modes, such as TappingMode™ (~1 nN). PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials.

Detailed Specifications

  • PeakForce Tapping® imaging for superior resolution and consistency
  • Legacy Contact Mode and Tapping Mode imaging also available
  • Substrate size range: small pieces (>2mm) up to 4" wafers
  • Computer controlled XY stage for superior sample positioning; piezo Z scan range ~ 12um
  • Basic electrical measurement techniques are available but only using Contact Mode imaging.
    • Scanning Capacitance Microscopy (SCM)
    • Conductive AFM (CAFM) for high currents, Tunneling AFM (TUNA) for low currents

See Also