File:Microscope Training - focus on edge crop - .jpg

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microscope - focusing on edge of wafer

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	Date/Time	Thumbnail	Dimensions	User	Comment
current	23:29, 14 May 2019		1,809 × 2,220 (578 KB)	John d (talk \| contribs)	microscope - focusing on edge of wafer

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Camera manufacturer	Apple
Camera model	iPhone 7
Exposure time	1/12 sec (0.083333333333333)
F Number	f/1.8
ISO speed rating	100
Date and time of data generation	16:40, 14 May 2019
Lens focal length	3.99 mm
Latitude	34° 24′ 55.68″ N
Longitude	119° 50′ 28.27″ W
Altitude	12.974 meters above sea level
Orientation	Normal
Horizontal resolution	72 dpi
Vertical resolution	72 dpi
Software used	12.2
File change date and time	16:40, 14 May 2019
Exposure Program	Normal program
Exif version	2.21
Date and time of digitizing	16:40, 14 May 2019
Meaning of each component	Y Cb Cr does not exist
APEX shutter speed	3.5862672866719
APEX aperture	1.6959938128384
APEX brightness	0.70478015328762
APEX exposure bias	0
Metering mode	Spot
Flash	Flash did not fire, auto mode
DateTimeOriginal subseconds	668
DateTimeDigitized subseconds	668
Supported Flashpix version	1
Sensing method	One-chip color area sensor
Scene type	A directly photographed image
Exposure mode	Auto exposure
White balance	Auto white balance
Focal length in 35 mm film	28 mm
Scene capture type	Standard
GPS time (atomic clock)	23:40
Speed unit	Kilometers per hour
Speed of GPS receiver	0
Reference for direction of image	True direction
Direction of image	147.02483737433
Reference for bearing of destination	True direction
Bearing of destination	147.02483737433
GPS date	14 May 2019
IIM version	2