File:IBD - Deposition Uniformity across a 6-inch wafer 2010-06-15 v2.png
Jump to navigation
Jump to search
Size of this preview: 800 × 482 pixels. Other resolutions: 320 × 193 pixels | 1,659 × 999 pixels.
Original file (1,659 × 999 pixels, file size: 202 KB, MIME type: image/png)
Plot of SiO2 thickness and refractive index across 6-inch wafer, from 2010-06-15 - Demis D. John
File history
Click on a date/time to view the file as it appeared at that time.
Date/Time | Thumbnail | Dimensions | User | Comment | |
---|---|---|---|---|---|
current | 11:25, 9 July 2024 | 1,659 × 999 (202 KB) | John d (talk | contribs) |
You cannot overwrite this file.
File usage
The following page uses this file: