Tool List: Difference between revisions
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__NOTOC__ |
__NOTOC__ |
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=Lithography= |
=Lithography= |
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* [[Suss Aligners]] |
* [[Suss Aligners]] |
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* [[IR Aligner]] |
* [[IR Aligner]] |
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* [[DUV Flood Expose]] |
* [[DUV Flood Expose]] |
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* [[Ovens]] |
* [[Ovens]] |
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* [[Stepper 1]] |
* [[Stepper 1]] |
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* [[Stepper 2]] |
* [[Stepper 2]] |
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* [[Stepper 3]] |
* [[Stepper 3]] |
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* [[E-Beam Lithography System]] |
* [[E-Beam Lithography System]] |
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=Vacuum Deposition= |
=Vacuum Deposition= |
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{| |
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* [[E-Beam 1]] |
* [[E-Beam 1]] |
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* [[E-Beam 2]] |
* [[E-Beam 2]] |
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* [[Sputter 3]] |
* [[Sputter 3]] |
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* [[Sputter 4]] |
* [[Sputter 4]] |
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* [[Sputter 5]] |
* [[Sputter 5]] |
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* [[PECVD 1]] |
* [[PECVD 1]] |
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* [[Molecular Vapor Deposition]] |
* [[Molecular Vapor Deposition]] |
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* [[Atomic Layer Deposision]] |
* [[Atomic Layer Deposision]] |
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|- |
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|} |
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=Dry Etch= |
=Dry Etch= |
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{| |
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* [[RIE 1]] |
* [[RIE 1]] |
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* [[RIE 2]] |
* [[RIE 2]] |
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* [[Ashers]] |
* [[Ashers]] |
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* [[VLR Etch]] |
* [[VLR Etch]] |
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* [[ICP Etch 1]] |
* [[ICP Etch 1]] |
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* [[ICP Etch 2]] |
* [[ICP Etch 2]] |
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* [[XeF2 Etch]] |
* [[XeF2 Etch]] |
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* [[Plasma Activation Tool]] |
* [[Plasma Activation Tool]] |
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=Wet Processing= |
=Wet Processing= |
Revision as of 22:09, 27 June 2012
Lithography
Vacuum Deposition
Dry Etch
Wet Processing
Thermal Processing
Packaging
Inspection, Test and Characterization
- Field Emission SEM 1
- Field Emission SEM 2
- Step Profile
- Step Profilometer
- Ellipsometer
- Microscopes
- Probe Station & Curve Tracer
- Optical Film Thickness (Filmetrics)
- Scanning Probe Microscope
- Tencor Flexus Film Stress
- Optical Film Thickness (Nanometric)
- SEM Sample Coater
- Surface Analysis
- Photo-emission & IR Microscope
- Ellipsometer (Woollam)
- Goniometer
- 4-Point Probe Resistivity Mapper