Dry Etching Recipes: Difference between revisions
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m (Change A to R1 per Demis, almost all A have been done before.) |
(Did process rankings for ICP2, I also deleted a redundant row for Ru, there were two Ru rows) |
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===<u>[[Process Group - Process Control Data#Etching .28Process Control Data.29|Process Control Data]]</u>=== |
===<u>f[[Process Group - Process Control Data#Etching .28Process Control Data.29|Process Control Data]]</u>=== |
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<small>''See above [[Process Group - Process Control Data#Etching .28Process Control Data.29|linked page]] for [https://en.wikipedia.org/wiki/Statistical_process_control process control data] (dep rate/stress etc. over time), for a selection of often-used dry etches''</small> |
<small>''See above [[Process Group - Process Control Data#Etching .28Process Control Data.29|linked page]] for [https://en.wikipedia.org/wiki/Statistical_process_control process control data] (dep rate/stress etc. over time), for a selection of often-used dry etches''</small> |
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|{{rl|ICP Etching Recipes|Al Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|Al Etch (Panasonic 1)}} |
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|R2 |
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|{{rl|ICP Etching Recipes|Al Etch (Panasonic 2)}} |
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|{{rl|ICP Etching Recipes|Cr Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|Cr Etch (Panasonic 1)}} |
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|R1 |
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|A |
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|A |
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|A |
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|A |
|A |
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|[https://wiki.nanofab.ucsb.edu/wiki/ICP_Etching_Recipes#Ru_.28Ruthenium.29_Etch_.28Panasonic_2.29 R4] |
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|{{Rl|ICP Etching Recipes|Ru (Ruthenium) Etch (Panasonic 2)}} |
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|A |
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|{{rl|ICP Etching Recipes|Ti Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|Ti Etch (Panasonic 1)}} |
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|R1 |
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|A |
|A |
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|[https://wiki.nanotech.ucsb.edu/w/index.php?title=ICP_Etching_Recipes#Al2O3_Etching_.28Panasonic_2.29 |
|[https://wiki.nanotech.ucsb.edu/w/index.php?title=ICP_Etching_Recipes#Al2O3_Etching_.28Panasonic_2.29 R4] |
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|{{rl|ICP Etching Recipes|Sapphire Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|Sapphire Etch (Panasonic 1)}} |
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|R1 |
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|{{rl|ICP Etching Recipes|GaAs-AlGaAs Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|GaAs-AlGaAs Etch (Panasonic 1)}} |
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|R3 |
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|{{rl|ICP Etching Recipes|GaAs Etch (Panasonic 2)}} |
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|[[ICP Etching Recipes#GaAs Etch .28Oxford ICP Etcher.29|R3]] |
|[[ICP Etching Recipes#GaAs Etch .28Oxford ICP Etcher.29|R3]] |
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|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|GaAs-AlGaAs Etch (Unaxis VLR)|GaAs Etch (Unaxis VLR)}} |
|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|GaAs-AlGaAs Etch (Unaxis VLR)|GaAs Etch (Unaxis VLR)}} |
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|{{rl|ICP Etching Recipes|GaN Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|GaN Etch (Panasonic 1)}} |
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|R1 |
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|[[ICP Etching Recipes#GaN Etch .28Oxford ICP Etcher.29|R2]] |
|[[ICP Etching Recipes#GaN Etch .28Oxford ICP Etcher.29|R2]] |
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|{{rl|ICP Etching Recipes|GaN Etch (Unaxis VLR)}} |
|{{rl|ICP Etching Recipes|GaN Etch (Unaxis VLR)}} |
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|A |
|A |
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|R1 |
|R1 |
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|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|GaSb Etch Unaxis VLR)}} |
|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|GaSb Etch Unaxis VLR)}} |
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|A |
|A |
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|[[ICP Etching Recipes#InP Ridge Etch .28Oxford ICP Etcher.29|R6]] |
|[[ICP Etching Recipes#InP Ridge Etch .28Oxford ICP Etcher.29|R6]] |
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|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|InP-InGaAs-InAlAs Etch (Unaxis VLR)|InP Etch (Unaxis VLR)}} |
|{{rl|ICP Etching Recipes|ICP-Etch (Unaxis VLR)|InP-InGaAs-InAlAs Etch (Unaxis VLR)|InP Etch (Unaxis VLR)}} |
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|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_.26_ARC_.28Fluorine_ICP_Etcher.29 R4] |
|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_.26_ARC_.28Fluorine_ICP_Etcher.29 R4] |
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|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_Etching_.28Panasonic_1.29 R] |
|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_Etching_.28Panasonic_1.29 R] |
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|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_etching_.28Panasonic_2.29 |
|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_etching_.28Panasonic_2.29 R3] |
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|A |
|A |
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!Ru |
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|A |
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|[[ICP Etching Recipes#Ru .28Ruthenium.29 Etch .28Panasonic 2.29|R]] |
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|- bgcolor="#eeffff" |
|- bgcolor="#eeffff" |
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! bgcolor="#d0e7ff" align="center" |SiC |
! bgcolor="#d0e7ff" align="center" |SiC |
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|{{rl|ICP Etching Recipes|SiC Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|SiC Etch (Panasonic 1)}} |
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|R4 |
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|[[ICP Etching Recipes#Si3N4 Etching .28Fluorine ICP Etcher.29|R4]] |
|[[ICP Etching Recipes#Si3N4 Etching .28Fluorine ICP Etcher.29|R4]] |
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|{{rl|ICP Etching Recipes|SiNx Etching (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|SiNx Etching (Panasonic 1)}} |
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|[https://wiki.nanofab.ucsb.edu/wiki/ICP_Etching_Recipes#SiNx_Etching_.28Panasonic_2.29 R3] |
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|{{rl|ICP Etching Recipes|SiNx Etching (Panasonic 2)}} |
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|[[ICP Etching Recipes#SiO2 Etching .28Fluorine ICP Etcher.29|R6]] |
|[[ICP Etching Recipes#SiO2 Etching .28Fluorine ICP Etcher.29|R6]] |
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|{{rl|ICP Etching Recipes|SiO2 Etching (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|SiO2 Etching (Panasonic 1)}} |
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|[https://wiki.nanofab.ucsb.edu/wiki/ICP_Etching_Recipes#SiO2_Etching_.28Panasonic_2.29 R6] |
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|{{rl|ICP Etching Recipes|SiO2 Etching (Panasonic 2)}} |
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|A |
|A |
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|R1 |
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|A |
|A |
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|[https://www.osapublishing.org/optica/abstract.cfm?uri=optica-4-5-532 |
|[https://www.osapublishing.org/optica/abstract.cfm?uri=optica-4-5-532 R1] |
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|{{rl|ICP Etching Recipes|W-TiW Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|W-TiW Etch (Panasonic 1)}} |
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|R1 |
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Revision as of 17:35, 30 July 2024
fProcess Control Data
See above linked page for process control data (dep rate/stress etc. over time), for a selection of often-used dry etches
Dry Etching Tools/Materials Table
The Key/Legend for this table's A...R6
values is at the bottom of the page.
Process Ranking Table
Processes in the table above are ranked by their "Process Maturity Level" as follows:
Process Level | Description of Process Level Ranking | ||||||||||
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A | Process Allowed and materials available but never done | ||||||||||
R1 | Process has been run at least once | ||||||||||
R2 | Process has been run and/or procedure is documented or/and data available | ||||||||||
R3 | Process has been run, procedure is documented, and data is available | ||||||||||
R4 | Process has a documented procedure with regular (≥4x per year) data or lookahead/in-situ control available | ||||||||||
R5 | Process has a documented procedure with regular (≥4x per year) data and lookahead/in-situ control available | ||||||||||
R6 | Process has a documented procedure, regular ( ≥4x per year) data, and control charts & limits available |