Dry Etching Recipes: Difference between revisions
Jump to navigation
Jump to search
Content deleted Content added
adding R4s to FICP W/TiW and OXFD GaAs |
made all R3s into R4s, could do a lookahead. Each R4 should have a procedure |
||
| Line 219: | Line 219: | ||
| |
| |
||
|A |
|A |
||
|[[ICP Etching Recipes#Ru .28Ruthenium.29 Etch .28Panasonic 2.29| |
|[[ICP Etching Recipes#Ru .28Ruthenium.29 Etch .28Panasonic 2.29|R4]] |
||
| |
| |
||
| |
| |
||
| Line 315: | Line 315: | ||
| |
| |
||
|A |
|A |
||
|[[ICP Etching Recipes#Al2O3 Etching .28Panasonic 2.29| |
|[[ICP Etching Recipes#Al2O3 Etching .28Panasonic 2.29|R4]] |
||
| |
| |
||
| |
| |
||
| Line 343: | Line 343: | ||
! bgcolor="#d0e7ff" align="center" |AlGaAs |
! bgcolor="#d0e7ff" align="center" |AlGaAs |
||
| |
| |
||
|[[RIE Etching Recipes| |
|[[RIE Etching Recipes|R4]] |
||
| |
| |
||
| |
| |
||
|{{rl|ICP Etching Recipes|GaAs-AlGaAs Etch (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|GaAs-AlGaAs Etch (Panasonic 1)}} |
||
| |
| |
||
|[[ICP Etching Recipes#GaAs Etch .28Oxford ICP Etcher.29| |
|[[ICP Etching Recipes#GaAs Etch .28Oxford ICP Etcher.29|R4]] |
||
| |
| |
||
| |
| |
||
| Line 406: | Line 406: | ||
|- bgcolor="#eeffff" |
|- bgcolor="#eeffff" |
||
! bgcolor="#d0e7ff" align="center" |CdZnTe |
! bgcolor="#d0e7ff" align="center" |CdZnTe |
||
|[[RIE Etching Recipes| |
|[[RIE Etching Recipes|R4]] |
||
| |
| |
||
| |
| |
||
| Line 508: | Line 508: | ||
| |
| |
||
| |
| |
||
|[[ICP Etching Recipes#InP Ridge Etch .28Oxford ICP Etcher.29| |
|[[ICP Etching Recipes#InP Ridge Etch .28Oxford ICP Etcher.29|R4]] |
||
| |
| |
||
| |
| |
||
| Line 567: | Line 567: | ||
!Photoresist & Organics |
!Photoresist & Organics |
||
| |
| |
||
|[[RIE Etching Recipes| |
|[[RIE Etching Recipes|R4]] |
||
| |
| |
||
|[[ICP Etching Recipes#Photoresist .26 ARC .28Fluorine ICP Etcher.29| |
|[[ICP Etching Recipes#Photoresist .26 ARC .28Fluorine ICP Etcher.29|R4]] |
||
|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_Etching_.28Panasonic_1.29 |
|[https://wiki.nanotech.ucsb.edu/wiki/ICP_Etching_Recipes#Photoresist_and_ARC_Etching_.28Panasonic_1.29 R4] |
||
|[[ICP Etching Recipes#Al2O3 Etching .28Panasonic 2.29| |
|[[ICP Etching Recipes#Al2O3 Etching .28Panasonic 2.29|R4]] |
||
| |
| |
||
| |
|R4 |
||
|[[Oxygen Plasma System Recipes#O2 Ashing| |
|[[Oxygen Plasma System Recipes#O2 Ashing|R4]] |
||
|[[Oxygen Plasma System Recipes#O2 Ashing| |
|[[Oxygen Plasma System Recipes#O2 Ashing|R4]] |
||
| |
| |
||
| |
| |
||
| Line 585: | Line 585: | ||
| |
| |
||
| |
| |
||
|[[ICP Etching Recipes#Photoresist .26 ARC .28Fluorine ICP Etcher.29| |
|[[ICP Etching Recipes#Photoresist .26 ARC .28Fluorine ICP Etcher.29|R4]] |
||
| |
| |
||
| |
| |
||
| Line 617: | Line 617: | ||
| |
| |
||
| |
| |
||
|[[ICP Etching Recipes#Si3N4 Etching .28Fluorine ICP Etcher.29| |
|[[ICP Etching Recipes#Si3N4 Etching .28Fluorine ICP Etcher.29|R4]] |
||
|{{rl|ICP Etching Recipes|SiNx Etching (Panasonic 1)}} |
|{{rl|ICP Etching Recipes|SiNx Etching (Panasonic 1)}} |
||
|[[ICP Etching Recipes#SiNx Etching .28Panasonic 2.29| |
|[[ICP Etching Recipes#SiNx Etching .28Panasonic 2.29|R4]] |
||
| |
| |
||
|[[Oxygen Plasma System Recipes#O2 Ashing| |
|[[Oxygen Plasma System Recipes#O2 Ashing|R4]] |
||
| |
| |
||
| |
| |
||
| Line 742: | Line 742: | ||
|- bgcolor="#ffffff" |
|- bgcolor="#ffffff" |
||
! bgcolor="#d0e7ff" align="center" |ZnS |
! bgcolor="#d0e7ff" align="center" |ZnS |
||
|[[RIE Etching Recipes| |
|[[RIE Etching Recipes|R4]] |
||
| |
| |
||
| |
| |
||
Revision as of 21:18, 14 August 2025
Process Control Data
See above linked page for process control data (dep rate/stress etc. over time), for a selection of often-used dry etches
Dry Etching Tools/Materials Table
Process Maturity Ranking
R6- most mature process with regular calibrations recorded on SPC charts.- …
R1- least mature - only run once ever.
The Key/Legend for this table's A...R6 values is at the bottom of the page.
Process Ranking Table
Processes in the table above are ranked by their "Process Maturity Level" as follows:
| Process Level | Description of Process Level Ranking | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| A | Process Allowed and materials available but never done | ||||||||||
| R1 | Process has been run at least once | ||||||||||
| R2 | Process has been run and/or procedure is documented or/and data available | ||||||||||
| R3 | Process has been run, procedure is documented, and data is available | ||||||||||
| R4 | Process has a documented procedure with regular (≥4x per year) data or lookahead/in-situ control available | ||||||||||
| R5 | Process has a documented procedure with regular (≥4x per year) data and lookahead/in-situ control available | ||||||||||
| R6 | Process has a documented procedure, regular ( ≥4x per year) data, and control charts & limits available | ||||||||||