Surface Analysis (KLA/Tencor Surfscan): Difference between revisions

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=Documentation=
=Documentation=
*[[media:Surfscan-Operation-Manual.pdf|Operations Manual]]
*[[media:Surfscan-Operation-Manual.pdf|Operations Manual]]
*[[media:Surfscan-Surfscan 6200 info.pdf|Surfscan Info]]
*[[Surfscan6200 photos]]

Revision as of 16:53, 12 April 2016

Surface Analysis (KLA/Tencor Surfscan)
KLA.jpg
Tool Type Inspection, Test and Characterization
Location Bay 5
Supervisor Biljana Stamenic
Supervisor Phone (805) 893-4002
Supervisor E-Mail biljana@ece.ucsb.edu
Description ?
Manufacturer Tencor


About

This system uses a laser-based scattering method to count size and distribution of particles (or other scattering defects) on a flat wafer surface.

Documentation

Retrieved from "https://wiki.nanofab.ucsb.edu/w/index.php?title=Surface_Analysis_(KLA/Tencor_Surfscan)&oldid=153939"