Sputtering Recipes: Difference between revisions
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=[[Sputter 1 (Custom)]]= |
=[[Sputter 1 (Custom)]]= |
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=[[Sputter 2 (SFI Endeavor)]]= |
=[[Sputter 2 (SFI Endeavor)]]= |
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== AlN<sub>x</sub> Deposition (Sputter |
== AlN<sub>x</sub> Deposition (Sputter 2) == |
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*[[media:19-AlN-Sputtering-Film-Sputter-2.pdf|AlN<sub>x</sub> Deposition Recipe]] |
*[[media:19-AlN-Sputtering-Film-Sputter-2.pdf|AlN<sub>x</sub> Deposition Recipe]] |
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Revision as of 16:09, 7 October 2013
Back to Vacuum Deposition Recipes.
Sputter 1 (Custom)
Sputter 2 (SFI Endeavor)
AlNx Deposition (Sputter 2)
Sputter 3 (AJA ATC 2000-F)
Sputter 4 (AJA ATC 2200-V)
Sputter 5 (Lesker AXXIS)
Ion Beam Deposition (Veeco NEXUS)
IBD Calibrations Spreadsheet - Records of historical film depositions (rates, indices), Uniformity etc.
All users are required to enter their calibration deps (simple test deps only)
SiO2 deposition (IBD)
- Refractive Index: ≈1.485
- Rate: ≈6.1nm/min (users must calibrate this prior to critical deps)
- Stress ≈ -320MPa (compressive)
Si3N4 deposition (IBD)
- Refractive Index ≈ 2.01
- Rate ≈ 4.5nm/min (users must calibrate this prior to critical deps)
- Stress ≈ -1756MPa (compressive)
Ta2O5 deposition (IBD)
- Refractive Index ≈ 2.10
- Rate ≈7.8nm/min (users must calibrate this prior to critical deps)
- Stress ≈ -140MPa (compressive)
TiO2 deposition (IBD)
- Refractive Index ≈ 2.3-2.4
- Rate ≈ 1.8nm/min
- Recipe: TiO2_dep