Ning Cao: Difference between revisions
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=About= |
=About= |
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Ph. D. In Physics (1995), McMaster University in Canada. |
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=Current Work= |
=Current Work= |
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Processing all kinds of semiconductor devices. with deep process experience: lithography, dry etch, film depositions, etc. |
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=Tools= |
=Tools= |
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{{PAGENAME}} |
{{PAGENAME}} is in charge of the following tools: |
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is in charge of the following tools: |
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*[[Holographic Lith/PL Setup (Custom)]] |
*[[Holographic Lith/PL Setup (Custom)]] |
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*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)|Filmetrics F50 - Optical Wafer Mapping]] |
*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)|Filmetrics F50 - Optical Wafer Mapping]] |
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*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Filmetrics F10-RT - Optical Reflection/Transmission Spectrometer]] |
*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Filmetrics F10-RT - Optical Reflection/Transmission Spectrometer]] |
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*[[Optical Film Thickness (Filmetrics)|Filmetrics F40UV - Microscope-mounted optical thin-film measurement]] |
*[[Optical Film Thickness (Filmetrics)|Filmetrics F40UV - Microscope-mounted optical thin-film measurement]] |
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*[[Ellipsometer (Woollam)|J.A. Woolam Ellipsometer - Thin-Film optical measurement & characterization]] |
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Latest revision as of 19:18, 24 March 2020
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About
Ph. D. In Physics (1995), McMaster University in Canada.
Current Work
Processing all kinds of semiconductor devices. with deep process experience: lithography, dry etch, film depositions, etc.
Tools
Ning Cao is in charge of the following tools: