Field Emission SEM 2 (JEOL IT800SHL): Difference between revisions

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(copied page from SEM1, linked to SEM1 page.)
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Please see the [https://wiki.nanofab.ucsb.edu/wiki/SEM_1_(JEOL_IT800SHL) SEM#1 page] for main tool details.
Please see the [https://wiki.nanofab.ucsb.edu/wiki/SEM_1_(JEOL_IT800SHL) SEM#1 page] for main tool details.


== EDAX Elemental Analysis ==
== EDS Elemental Analysis ==
*EDS Operating Procedure
'''Information to be added'''

Revision as of 18:03, 27 September 2023

Field Emission SEM 2 (JEOL IT800SHL)
SEM1 JEOL IT800HSL.jpg
Location Bay 1
Tool Type Inspection, Test and Characterization
Manufacturer JEOL USA Inc
Description JEOL 7600F FESEM
Primary Supervisor Aidan Hopkins
(805) 893-2343
hopkins@ece.ucsb.edu

Secondary Supervisor

Bill Mitchell

Recipes
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About

The JEOL IT800HSL Field Emission Scanning Electron Microscope is used for imaging a variety of samples made in the facility.

Identical to SEM#1, but with EDAX module added.

Please see the SEM#1 page for main tool details.

EDS Elemental Analysis

  • EDS Operating Procedure
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