Vacuum Deposition Recipes: Difference between revisions
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IBD AlO and TiO to R4 |
→Process Ranking Table: adding to R4 definition |
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| bgcolor="#eeffff" |[[Sputtering Recipes#Si3N4 deposition .28IBD.29| |
| bgcolor="#eeffff" |[[Sputtering Recipes#Si3N4 deposition .28IBD.29|R3]] |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Al2O3 deposition .28ALD CHAMBER 3.29| |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Al2O3 deposition .28ALD CHAMBER 3.29|R3]] |
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|[[Atomic Layer Deposition Recipes#AlN deposition .28ALD CHAMBER 3.29| |
|[[Atomic Layer Deposition Recipes#AlN deposition .28ALD CHAMBER 3.29|R3]] |
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| bgcolor="#eeffff" |[[Process Group - Process Control Data#E-Beam 4: Au|R6]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R1]] |
| bgcolor="#eeffff" |[[Sputtering Recipes|R1]] |
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| bgcolor="#eeffff" |R2 |
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| bgcolor="#eeffff" |[[Thermal Evaporation Recipes#Thermal Evaporator 1|R3]] |
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|[https://wiki.nanotech.ucsb.edu/w/index.php?title=Sputtering_Recipes#Sputter_3_.28AJA_ATC_2000-F.29 R3] |
|[https://wiki.nanotech.ucsb.edu/w/index.php?title=Sputtering_Recipes#Sputter_3_.28AJA_ATC_2000-F.29 R3] |
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|{{Rl|Sputtering_Recipes|Sputter_5_.28AJA_ATC_2200-V.29| |
|{{Rl|Sputtering_Recipes|Sputter_5_.28AJA_ATC_2200-V.29|R6}} |
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|[[Thermal Evaporation Recipes#Thermal Evaporator 1|R3]] |
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! bgcolor="#d0e7ff" align="center" |Ge |
! bgcolor="#d0e7ff" align="center" |Ge |
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! bgcolor="#d0e7ff" align="center" |GeO<sub>2</sub> |
! bgcolor="#d0e7ff" align="center" |GeO<sub>2</sub> |
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|[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29| |
|[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29|R1]] |
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|[[Atomic Layer Deposition Recipes#AlN deposition .28ALD CHAMBER 3.29|R3]] |
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|[[Atomic Layer Deposition Recipes#AlN deposition .28ALD CHAMBER 3.29|R4]] |
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! bgcolor="#d0e7ff" align="center" |Ir |
! bgcolor="#d0e7ff" align="center" |Ir |
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! bgcolor="#d0e7ff" align="center" |ITO |
! bgcolor="#d0e7ff" align="center" |ITO |
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| bgcolor="#eeffff" |[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29| |
| bgcolor="#eeffff" |[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29|R4]] |
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! bgcolor="#d0e7ff" align="center" |Pd |
! bgcolor="#d0e7ff" align="center" |Pd |
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|[[E-Beam Evaporation Recipes#E-Beam 3 .28Temescal.29|R2]] |
|[[E-Beam Evaporation Recipes#E-Beam 3 .28Temescal.29|R2]] |
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|[[E-Beam Evaporation Recipes#E-Beam 4 .28CHA.29|R2]] |
|[[E-Beam Evaporation Recipes#E-Beam 4 .28CHA.29|R2]] |
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|[[Sputtering Recipes|R1]] |
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|[[Thermal Evaporation Recipes#Thermal Evaporator 1|R3]] |
|[[Thermal Evaporation Recipes#Thermal Evaporator 1|R3]] |
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| bgcolor="#eeffff" |<br> |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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|[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
|[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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! bgcolor="#d0e7ff" align="center" |Si |
! bgcolor="#d0e7ff" align="center" |Si |
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|[[PECVD Recipes#Low Stress Si3N4 .28PECVD.231.29| |
|[[PECVD Recipes#Low Stress Si3N4 .28PECVD.231.29|R3]] |
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|[[PECVD Recipes#Low-Stress SiN deposition .28PECVD .232.29|R6]] |
|[[PECVD Recipes#Low-Stress SiN deposition .28PECVD .232.29|R6]] |
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|[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
|[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
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| bgcolor="#eeffff" |[[PECVD Recipes#SiO2 deposition .28PECVD .232.29|R6]] |
| bgcolor="#eeffff" |[[PECVD Recipes#SiO2 deposition .28PECVD .232.29|R6]] |
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| bgcolor="#eeffff" |[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
| bgcolor="#eeffff" |[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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!SiO<sub>x</sub> |
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|[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29|R1]] |
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|[[PECVD Recipes#SiO2 deposition .28PECVD .231.29| |
|[[PECVD Recipes#SiO2 deposition .28PECVD .231.29|R3]] |
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|[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29|R1]] |
|[[E-Beam Evaporation Recipes#E-Beam 2 .28Custom.29|R1]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes| |
| bgcolor="#eeffff" |[[Sputtering Recipes|R6]] |
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| bgcolor="#eeffff" |R1 |
| bgcolor="#eeffff" |R1 |
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|[[Sputtering Recipes#Sputter 4 (AJA ATC 2200-V)|R3]] |
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|[https://wiki.nanotech.ucsb.edu/w/index.php?title=Sputtering_Recipes#Sputter_4_.28AJA_ATC_2200-V.29 R3] |
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|[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
|[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes| |
| bgcolor="#eeffff" |[[Sputtering Recipes#TiW Co-Sputter Deposition (Sputter 3)|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
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! bgcolor="#d0e7ff" align="center" |TiO<sub>2</sub> |
! bgcolor="#d0e7ff" align="center" |TiO<sub>2</sub> |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes#Si3N4 deposition .28IBD.29| |
| bgcolor="#eeffff" |[[Sputtering Recipes#Si3N4 deposition .28IBD.29|R3]] |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes| |
| bgcolor="#eeffff" |[[Sputtering Recipes#TiW Co-Sputter Deposition (Sputter 3)|R3]] |
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| bgcolor="#eeffff" |[[Sputtering Recipes|R3]] |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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! bgcolor="#d0e7ff" align="center" |Zr |
! bgcolor="#d0e7ff" align="center" |Zr |
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| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29| |
| bgcolor="#eeffff" |[[Atomic Layer Deposition Recipes#Pt deposition .28ALD CHAMBER 1.29|R3]] |
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Processes in the table above are ranked by their "''Process Maturity Level''" as follows: |
Processes in the table above are ranked by their "''Process Maturity Level''" as follows: |
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{| class="wikitable" |
{| class="wikitable" |
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!Process Level |
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! colspan="11" |Description of Process Level Ranking |
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|A |
|A |
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| colspan="11" |Process '''A'''llowed and materials available but never |
| colspan="11" |Process '''A'''llowed and materials available but never done |
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|R1 |
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|R2 |
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| colspan="11" |Process has been ran and |
| colspan="11" |Process has been ran and procedure is documented |
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|R3 |
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|R4 |
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| colspan="11" |Process has a documented procedure with regular (≥4x per year) data ''' |
| colspan="11" |Process has a documented procedure with regular (≥4x per year) data '''no''' in-Situ control available |
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|R5 |
|R5 |
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| colspan="11" |Process has a documented procedure with regular (≥4x per year) data '''and''' |
| colspan="11" |Process has a documented procedure with regular (≥4x per year) data '''and''' in-Situ control available |
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|- |
|- |
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|R6 |
|R6 |
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| colspan="11" |Process has a documented procedure |
| colspan="11" |Process has a documented procedure and control charts/limits available. Controlled process. |
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|} |
|} |
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[[Category:Processing]] |
[[Category:Processing]] |
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Latest revision as of 19:59, 22 August 2025
Process Control Data
See linked page for process control data (calibration data over time, such as dep. rate, refractive index, stress etc.) over time, for a selection of highly used tools/films.
Deposition Tools/Materials Table
Process Maturity Ranking
R6- most mature process with regular calibrations recorded on SPC charts.- …
R1- least mature - "possible" but you'll have to figure it out.
The Key/Legend for this table's R1...R6 values is at the bottom of the page.
Process Ranking Table
Processes in the table above are ranked by their "Process Maturity Level" as follows:
| Process Level | Description of Process Level Ranking | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| A | Process Allowed and materials available but never done | ||||||||||
| R1 | Process has been ran at least once | ||||||||||
| R2 | Process has been ran and procedure is documented | ||||||||||
| R3 | Process has been ran, procedure is documented, and data is available | ||||||||||
| R4 | Process has a documented procedure with regular (≥4x per year) data no in-Situ control available | ||||||||||
| R5 | Process has a documented procedure with regular (≥4x per year) data and in-Situ control available | ||||||||||
| R6 | Process has a documented procedure and control charts/limits available. Controlled process. | ||||||||||