E-Beam Lithography System (Raith EBPG 5150+)

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E-Beam Lithography System (Raith EBPG 5150+)
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Tool Type Lithography
Location Bay 7
Supervisor Bill Mitchell
Supervisor Phone (805) 893-4974
Supervisor E-Mail mitchell@ece.ucsb.edu
Description Vector Scan Electron Beam Lithography System
Manufacturer Raith GmbH
Model EBPG 5150+
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About

TBD

Detailed Specifications

  • Maximum write area:
  • Maximum wafer/substrate size:
  • Cassette loader/substrate holders available
  • Beam Voltage: 100kV
  • Min/Maximum Current (Dose):
  • Scanner Speed (or other speed specs):
  • Layer-to-Layer Alignment Accuracy:
  • Options purchased:
    • Non-Manhattan scanning for curved edges
    • Stand-alone optical alignment station
    • OTHER

(Other EBL-specific specs)


  • Advanced Fracturing software available (Layout BEAMER from GeniSys, Inc)
    • automated proximity correction of patterns possible
    • ability to manually position write fields within a pattern for optimum inter-field writing performance
    • ability to adjust beam scanning strategy within a write field for optimum intra-field writing performance
    • fine tuning of line-edge roughness by shot pitch correction

Recipes

All recipes can be found on the following page: