Step Profilometer (KLA Tencor P-7): Difference between revisions

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|picture=KLA-Tencor-P7_Photo.JPG
|picture=KLA-Tencor-P7_Photo.JPG
|type = Inspection, Test and Characterization
|type = Inspection, Test and Characterization
|super= Brian Lingg
|super= Bill Millerski
|phone=(805)839-3918x210
|phone=(805)839-3918x210
|location=Bay 4
|location=Bay 4

Revision as of 15:31, 28 October 2021

Step Profilometer (KLA Tencor P-7)
KLA-Tencor-P7 Photo.JPG
Tool Type Inspection, Test and Characterization
Location Bay 4
Supervisor Bill Millerski
Supervisor Phone (805) 893-2655
Supervisor E-Mail wmillerski@ucsb.edu
Description Surface Profilometer
Manufacturer KLA Tencor


About

The KLA Tencor info will be here

Detailed Specifications

  • Probe Tip has a 2um radius and a 60 degree angle
  • Maximum wafer size: ____
  • 1D Profile and 2D Raster Scanning
  • Lateral Resolution: _____
  • Height Resolution: _____

Instructions

Retrieved from "https://wiki.nanofab.ucsb.edu/w/index.php?title=Step_Profilometer_(KLA_Tencor_P-7)&oldid=159368"