Vacuum Deposition Recipes: Difference between revisions
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|[[PECVD Recipes#Low-Stress SiN deposition .28PECVD .232.29|R6]] |
|[[PECVD Recipes#Low-Stress SiN deposition .28PECVD .232.29|R6]] |
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|[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
|[[PECVD Recipes#ICP-PECVD .28Unaxis VLR.29|R6]] |
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!SiN - Low Stress 3xTime |
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|[[PECVD Recipes#Low-Stress SiN 3xTime (PECVD #2)|R6]] |
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Revision as of 17:20, 24 July 2025
Process Control Data
See linked page for process control data (calibration data over time, such as dep. rate, refractive index, stress etc.) over time, for a selection of highly used tools/films.
Deposition Tools/Materials Table
The Key/Legend for this table's R1...R6 values is at the bottom of the page.
Process Ranking Table
Processes in the table above are ranked by their "Process Maturity Level" as follows:
| Process Level | Description of Process Level Ranking | ||||||||||
| A | Process Allowed and materials available but never done | ||||||||||
| R1 | Process has been ran at least once | ||||||||||
| R2 | Process has been ran and/or procedure is documented or/and data available | ||||||||||
| R3 | Process has been ran, procedure is documented, and data is available | ||||||||||
| R4 | Process has a documented procedure with regular (≥4x per year) data or lookahead/in-Situ control available | ||||||||||
| R5 | Process has a documented procedure with regular (≥4x per year) data and lookahead/in-Situ control available | ||||||||||
| R6 | Process has a documented procedure, regular ( ≥4x per year) data, and control charts/limits available | ||||||||||