Deletion log
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Below is a list of the most recent deletions.
(newest | oldest) View (newer 20 | older 20) (20 | 50 | 100 | 250 | 500)- 13:06, 3 May 2024 John d talk contribs deleted page ASML 5500 Mask Making Guidelines (Moved data to another page: Moved to access-restricted google drive: https://docs.google.com/document/d/1b9YT11RPsl-UlLvN74hrQvG01OcYDL16r6I5lPOlBEo/edit?usp=sharing)
- 17:48, 16 January 2024 Thibeault talk contribs deleted page File:OlympusDSX1000.jpg (user request to remove image of their part)
- 12:33, 8 January 2024 Biljana talk contribs deleted page File:Single centered mask-Piece 2nd litho AUTOSTEP 200.pdf
- 12:33, 8 January 2024 Biljana talk contribs deleted page File:4 Quads mask plate Piece - 2nd litho AUTOSTEP 200 (1).pdf
- 11:41, 8 January 2024 Biljana talk contribs deleted page File:Autostep 200 - Setting up the Job.pdf
- 15:40, 5 January 2024 Biljana talk contribs deleted page File:GCA 6300 Standard Operating Procedure 122823.pdf (have two files with the same name)
- 15:38, 5 January 2024 Biljana talk contribs deleted page File:GCA 6300 Standard Operating Procedure 122823.pdf
- 11:31, 4 January 2024 John d talk contribs deleted page KLA-Tencor Surfscan - Standard Operating Procedure (Moved data to another page: content was: "This tool can be used for scanning 4", 6" and 8" wafers. Pieces could be also scanned, but they need to be mounted on either 4" or 8" wafer. The maximum thickness of a wafer (or a wafer+mounted piece) is up to 1mm. ==SURFSCAN 6200== LOG IN using the access code: '''boss''' ( if the keyboard is not working use the virtual keyboard on the monitor). Double click on the icon...", and the only contributor was "Biljana"...)
- 17:15, 21 December 2023 Biljana talk contribs deleted page File:SURFSCAN 6200 122123 for 2 and 3inch wafers.pdf
- 15:51, 21 December 2023 Biljana talk contribs deleted page Surfscan 6200 8inch wafers
- 13:45, 2 November 2023 John d talk contribs deleted page SSI Solaris 150 - Operating Procedure (Moved data to another page: content was: "'''Solaris (SSI) RTP Operating Instructions''' 1) On the main system press the green power on button. You will hear a loud click and hear air flowing. If you do not hear anything after pressing the green button, try rotating the EMO button and then press the green power on button again. 2) Press down on the door lever and gently pull out the wafer tray. Verify that a previou...", and the only contributor was "Lingg"...)
- 17:08, 1 November 2023 John d talk contribs deleted page UNAVAILABLE - Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D) (Equipment is not available anymore: content was: "{{tool |name=Optical Profilometer - Filmetrics Profilm3D |picture=Filmetrics_Profilm3D_System_Photo.png |type = Inspection, Test and Characterization |super= |location=UNAVAILABLE |description = Optical Profilometer |manufacturer = [http://filmetrics.com Filmetrics Inc.] |model = Profilm3D |toolid= }} '''THIS TOOL HAS BEEN REMOVED FROM THE LAB AND IS UNAVAILABLE as of 2019.'''...", and the only contributor was "[[Special:Contributions/John d...)
- 17:07, 1 November 2023 John d talk contribs deleted page Profilm3D - Quick Start - Surface Roughness Measurement (PSI Mode) (Equipment is not available anymore: content was: " '''THIS TOOL IS CURRENTLY UNAVAILABLE.''' Please see the <u>Olympus LEXT Confocal Microscope</u> for similar capabilities. ==Measurement Procedure== *Turn objective to 10x *Select Recipe - '''''PSI Roughness''''' or '''''WLI Step Height''''' (re-selecting reloads defaults, removing the ''<unsaved>'' label) **If it asks you to rotate the objective, click "''Update Recipe''" to keep it on the...)
- 16:56, 1 November 2023 John d talk contribs deleted page Step Profile (Dektak IIA) (Equipment is not available anymore: content was: "{{tool|{{PAGENAME}} |picture=Dektak2A.jpg |type = Inspection, Test and Characterization |super= Mike Silva |phone=(805)839-3918x219 |location=Bay 4 |email=silva@ece.ucsb.edu |description = Dektak Profilometer |manufacturer = Sloan (now Veeco) |materials = }} '''This tool has been decommissioned and removed from the lab, as of 2018-10-09.''' '''Information on this page is for reference/historical purposes only.''' = About = The Dektak is a...)
- 16:50, 1 November 2023 John d talk contribs deleted page GCA 6300 Stepper Training MAnual-Full version (Broken redirect: content was: "GCA 6300 Stepper Training Manual - Full version. pdf", and the only contributor was "Biljana" (talk))
- 16:48, 1 November 2023 John d talk contribs deleted page File:Logitech WBS7 Bonder Schematic from Manual.png (Copyright violation)
- 15:43, 1 November 2023 John d talk contribs deleted page File:Olympus - BHM Microscope - Instruction Manual.pdf (Copyright violation: also not linked anywhere on site)
- 12:14, 1 November 2023 John d talk contribs deleted page File:CompleteEASE Manual.pdf (Copyright violation: proprietary requested removal by Woollam)
- 20:21, 30 October 2023 John d talk contribs deleted page Template:Homepage RightSideBar (merged into main homepage, removed right side bar entriely. content was: "'''Other Links:''' * [http://signupmonkey.ece.ucsb.edu SignUpMonkey] * [http://nanofab.ucsb.edu NanoTech Homepage] * [http://www.ece.ucsb.edu UCSB EE Dept.] * [https://nanofab.ucsb.edu/services Get into the Lab] * [https://nanofab.ucsb.edu/services#fabrication-services Fabrication Services]", and the only contributor was "John d" (talk))
- 15:34, 4 April 2023 John d talk contribs deleted page Field Emission SEM 1 (FEI Sirion) (Equipment is not available anymore: content was: "{{tool2|{{PAGENAME}} |picture=SEM1.jpg |type = Inspection, Test and Characterization |super= Aidan Hopkins |super2= Bill Mitchell |location=Bay 1 |description = FEI Thermal Field Emission SEM Sirion with EDAX Falcon EDX system |manufacturer = FEI |materials = |toolid=4 }} =About= This system is a tri-use FESEM imaging and inspection system, EDX elemental analysis system, and small-area electron beam lithography system. The system uses a ther...)