Tony Bosch: Difference between revisions

From UCSB Nanofab Wiki
Jump to navigation Jump to search
Line 35: Line 35:
*[[Probe Station & Curve Tracer]]
*[[Probe Station & Curve Tracer]]
*[[Optical Film Thickness (Filmetrics)]]
*[[Optical Film Thickness (Filmetrics)]]
*[[SEM Sample Coater (Hummer)]]
*[[Resistivity Mapper (CDE RESMAP)]]
*[[Resistivity Mapper (CDE RESMAP)]]
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]

Revision as of 16:55, 20 April 2020