Tool List: Difference between revisions
Jump to navigation
Jump to search
Line 27: | Line 27: | ||
{| |
{| |
||
|-valign="top" |
|-valign="top" |
||
|width= |
|width=300| |
||
* [[E-Beam 1 (Sharon)]] |
* [[E-Beam 1 (Sharon)]] |
||
* [[E-Beam 2 (Custom)]] |
* [[E-Beam 2 (Custom)]] |
||
Line 34: | Line 34: | ||
* [[Sputter 1 (Custom)]] |
* [[Sputter 1 (Custom)]] |
||
* [[Sputter 2 (SFI Endeavor)]] |
* [[Sputter 2 (SFI Endeavor)]] |
||
* [[Sputter 3]] |
* [[Sputter 3 (AJA)]] |
||
* [[Sputter 4]] |
* [[Sputter 4 (AJA)]] |
||
⚫ | |||
* [[Sputter 5 (Lesker AXXIS)]] |
* [[Sputter 5 (Lesker AXXIS)]] |
||
⚫ | |||
* [[PECVD 1]] |
* [[PECVD 1 (PlasmTherm 790)]] |
||
* [[PECVD 2 (Advanced Vacuum)]] |
* [[PECVD 2 (Advanced Vacuum)]] |
||
* [[Thermal Evap 1]] |
|||
* [[Thermal Evap 2]] |
|||
* [[Unaxis VLR ICP-PECVD]] |
* [[Unaxis VLR ICP-PECVD]] |
||
* [[Ion Beam Deposition (Veeco NEXUS)]] |
|||
* [[IBD]] |
|||
* [[Molecular Vapor Deposition]] |
* [[Molecular Vapor Deposition]] |
||
* [[Atomic Layer Deposision (Oxford Flexal)]] |
* [[Atomic Layer Deposision (Oxford Flexal)]] |
Revision as of 19:47, 28 June 2012
Lithography
Vacuum Deposition
Dry Etch
Wet Processing
Thermal Processing
- Rapid Thermal Processor
- Strip Annealer
- Tube Furnace (Tystar 8300)
- Tube Furnace Wafer Bonding (Thermco)
- Tube Furnace AlGaAs Oxidation (Linberg)
Packaging
Inspection, Test and Characterization
- Field Emission SEM 1
- Field Emission SEM 2
- Step Profile
- Step Profilometer
- Ellipsometer
- Microscopes
- Probe Station & Curve Tracer
- Optical Film Thickness (Filmetrics)
- Scanning Probe Microscope
- Tencor Flexus Film Stress
- Optical Film Thickness (Nanometric)
- SEM Sample Coater
- Surface Analysis
- Photo-emission & IR Microscope
- Ellipsometer (Woollam)
- Goniometer
- 4-Point Probe Resistivity Mapper