Tool List: Difference between revisions
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* [[Step Profilometer (KLA Tencor P-7)]] |
* [[Step Profilometer (KLA Tencor P-7)]] |
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* [[Step Profilometer (Dektak 6M)]] |
* [[Step Profilometer (Dektak 6M)]] |
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* [[Atomic Force Microsope (Dimension 3100/Nanoscope IVA)]] |
* [[Atomic Force Microsope (Dimension 3100/Nanoscope IVA)|Atomic Force Microsope (Bruker ICON)]] |
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* [[Surface Analysis (KLA/Tencor Surfscan)]] |
* [[Surface Analysis (KLA/Tencor Surfscan)]] |
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** ''Sub-micron Particle Counter'' |
** ''Sub-micron Particle Counter'' |
Revision as of 18:09, 30 November 2018
Lithography
You can see our available photoresists on the Chemical Datasheets page.
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
|
Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)
Etch Monitoring
|
ICP-RIE
Other Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.