Tool List: Difference between revisions
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(→Topographical Metrology: removed Rudolph Ellips & old Dektak) |
(→Dry Etch: link to etch monitors, specifically Laser Etch Monitoring page) |
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*[[Plasma Activation (EVG 810)]] |
*[[Plasma Activation (EVG 810)]] |
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*[[CAIBE (Oxford Ion Mill)]] |
*[[CAIBE (Oxford Ion Mill)]] |
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===== Etch Monitoring ===== |
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* [[Laser Etch Monitoring]] (Endpoint Detection) |
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* Optical Emission Spectra |
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* Residual Gas Analyzer (RGA) |
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===== ICP-RIE ===== |
===== ICP-RIE ===== |
Revision as of 18:17, 9 November 2018
Lithography
You can see our available photoresists on the Chemical Datasheets page.
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
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Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)
Etch Monitoring
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ICP-RIE
Other Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.