Tool List: Difference between revisions

From UCSB Nanofab Wiki
Jump to navigation Jump to search
Line 123: Line 123:
* [[Photo-emission & IR Microscope (QFI)]]
* [[Photo-emission & IR Microscope (QFI)]]
* [[Ellipsometer (Woollam)]]
* [[Ellipsometer (Woollam)]]
* [[4-Point Probe Resistivity Mapper]]
* [[Resistivity Mapper (CDE RESMAP)]]
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]]
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]]
* [[Deep UV Optical Microscope (Olympus)]]
* [[Deep UV Optical Microscope (Olympus)]]

Revision as of 18:45, 11 July 2012

Lithography

Vacuum Deposition

Dry Etch

Wet Processing

Thermal Processing

Packaging

Inspection, Test and Characterization