Tool List: Difference between revisions
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===== Optical/Electron Microscopy ===== |
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* [[Field Emission SEM 1 (FEI Sirion)]] |
* [[Field Emission SEM 1 (FEI Sirion)]] |
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* [[Field Emission SEM 2 (JEOL 7600F)]] |
* [[Field Emission SEM 2 (JEOL 7600F)]] |
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===== Topographical Metrology ===== |
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* [[Step Profile (Dektak IIA)]] |
* [[Step Profile (Dektak IIA)]] |
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* [[Step Profilometer (Dektak 6M)]] |
* [[Step Profilometer (Dektak 6M)]] |
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** ''Sub-micron Particle Counter'' |
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* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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===== Thin-Film Analysis/Measurement ===== |
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* [[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]] |
* [[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]] |
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* [[Optical Film Thickness (Nanometric)]] |
* [[Optical Film Thickness (Nanometric)]] |
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* [[Resistivity Mapper (CDE RESMAP)]] |
* [[Resistivity Mapper (CDE RESMAP)]] |
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===== Other Tools ===== |
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Revision as of 21:59, 3 July 2018
Lithography
You can see our available photoresists on the Chemical Datasheets page.
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
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Vacuum Deposition
Dry Etch
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
- Rapid Thermal Processor (AET RX6)
- Strip Annealer
- Tube Furnace (Tystar 8300)
- Tube Furnace Wafer Bonding (Thermco)
- Tube Furnace AlGaAs Oxidation (Linberg)
- Wafer Bonder (SUSS SB6-8E)
- Ovens 1, 2 & 3 (Labline)
- Oven 4 (Fisher)
- Oven 5 (Labline)
- High Temp Oven (Blue M)
- Vacuum Oven (YES)
Packaging
Inspection, Test and Characterization
Optical/Electron Microscopy
Topographical Metrology |
Thin-Film Analysis/Measurement
Other Tools |