Tool List: Difference between revisions
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(→Dry Etch: correct YES EcoClean link) |
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===== |
=====Photoresists and Lithography Chemicals===== |
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* See the [https://www.nanotech.ucsb.edu/wiki/index.php/Lithography_Recipes#Chemicals_Stocked_.2B_Datasheets Chemical Datasheets page]. |
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*See the [https://www.nanotech.ucsb.edu/wiki/index.php/Lithography_Recipes#Chemicals_Stocked_.2B_Datasheets Chemical Datasheets page]. |
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===== Contact Aligners (Optical Exposure) ===== |
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* [[Suss Aligners (SUSS MJB-3)]] |
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* [[IR Aligner (SUSS MJB-3 IR)]] |
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* [[Contact Aligner (SUSS MA-6)]] |
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* [[DUV Flood Expose]] |
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===== |
=====Contact Aligners (Optical Exposure)===== |
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* [[E-Beam Lithography System (JEOL JBX-6300FS)]] |
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* |
*[[Suss Aligners (SUSS MJB-3)]] |
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*[[IR Aligner (SUSS MJB-3 IR)]] |
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* [[Holographic Lith/PL Setup (Custom)|Holographic Litho/PL Setup (Custom)]] |
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*[[Contact Aligner (SUSS MA-6)]] |
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*[[DUV Flood Expose]] |
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=====Other Patterning Systems===== |
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*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
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*[[Nano-Imprint (Nanonex NX2000)]] |
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*[[Holographic Lith/PL Setup (Custom)|Holographic Litho/PL Setup (Custom)]] |
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===== |
=====Steppers (Optical Exposure)===== |
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* [[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]] |
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* |
*[[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]] |
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* |
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]] |
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*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]] |
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=====Thermal Processing for Photolithography===== |
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*[[Ovens - Overview of All Lab Ovens|Ovens - Overview of all lab ovens]] |
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===== Thermal Processing for Photolithography ===== |
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*[[Ovens 1, 2 & 3 (Labline)]] |
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* [[Ovens - Overview of All Lab Ovens|Ovens - Overview of all lab ovens]] |
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* |
*[[Oven 4 (Fisher)]] |
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*[[Oven 5 (Labline)]] |
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* |
*[[High Temp Oven (Blue M)]] |
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* |
*[[Vacuum Oven (YES)]] |
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*The [https://www.nanotech.ucsb.edu/wiki/index.php/Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes. |
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* [[Vacuum Oven (YES)]] |
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* The [https://www.nanotech.ucsb.edu/wiki/index.php/Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes. |
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= |
=Vacuum Deposition= |
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{| |
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===== |
=====Physical Vapor Deposition (PVD)===== |
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*[[E-Beam 1 (Sharon)]] |
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*[[E-Beam 2 (Custom)]] |
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*[[E-Beam 3 (Temescal)]] |
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*[[E-Beam 4 (CHA)]] |
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*[[Thermal Evap 1]] |
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*[[Thermal Evap 2 (Solder)]] |
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*[[E-Beam 1 (Sharon)]] |
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===== Sputter Deposition ===== |
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*[[ |
*[[E-Beam 2 (Custom)]] |
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*[[ |
*[[E-Beam 3 (Temescal)]] |
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*[[E-Beam 4 (CHA)]] |
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*[[Thermal Evap 1]] |
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*[[Thermal Evap 2 (Solder)]] |
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=====Sputter Deposition===== |
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*[[Sputter 3 (AJA ATC 2000-F)]] |
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*[[Sputter 4 (AJA ATC 2200-V)]] |
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*[[Sputter 5 (AJA ATC 2200-V)]] |
*[[Sputter 5 (AJA ATC 2200-V)]] |
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*[[Ion Beam Deposition (Veeco NEXUS)]] |
*[[Ion Beam Deposition (Veeco NEXUS)]] |
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===== |
=====Chemical Vapor Deposition (CVD)===== |
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*[[PECVD 1 (PlasmaTherm 790)]] |
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*[[PECVD |
*[[PECVD 1 (PlasmaTherm 790)]] |
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*[[ |
*[[PECVD 2 (Advanced Vacuum)]] |
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*[[ |
*[[ICP-PECVD (Unaxis VLR)]] |
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*[[Molecular Vapor Deposition]] |
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*[[Atomic Layer Deposision (Oxford FlexAL)|Atomic Layer Deposition (Oxford FlexAL)]] |
*[[Atomic Layer Deposision (Oxford FlexAL)|Atomic Layer Deposition (Oxford FlexAL)]] |
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= |
=Dry Etch= |
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{| |
{| |
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===== |
=====Reactive Ion Etching (RIE)===== |
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*[[RIE 2 (MRC)]] |
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*[[RIE |
*[[RIE 2 (MRC)]] |
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*[[RIE |
*[[RIE 3 (MRC)]] |
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*[[ |
*[[RIE 5 (PlasmaTherm)]] |
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*[[ |
*[[Ashers (Technics PEII)]] |
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*[[ |
*[[Plasma Clean (Gasonics 2000)]] |
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*[[Plasma |
*[[Plasma Clean (YES EcoClean)]] |
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*[[Plasma Activation (EVG 810)]] |
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*[[CAIBE (Oxford Ion Mill)]] |
*[[CAIBE (Oxford Ion Mill)]] |
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===== |
=====Etch Monitoring===== |
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* [[Laser Etch Monitoring]] (Endpoint Detection) |
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*[[Laser Etch Monitoring]] (Endpoint Detection) |
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* Optical Emission Spectra |
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*Optical Emission Spectra |
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* Residual Gas Analyzer (RGA) |
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*Residual Gas Analyzer (RGA) |
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===== |
=====ICP-RIE===== |
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*[[ICP Etch 1 (Panasonic E626I)]] |
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*[[ICP Etch |
*[[ICP Etch 1 (Panasonic E626I)]] |
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*[[ICP Etch 2 (Panasonic E640)]] |
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*[[ICP-Etch (Unaxis VLR)]] |
*[[ICP-Etch (Unaxis VLR)]] |
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*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Plasma-Therm SLR: Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Plasma-Therm SLR: Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
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*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
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=====Other Dry Etching===== |
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*[[UV Ozone Reactor]] |
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===== Other Dry Etching ===== |
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*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
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*[[UV Ozone Reactor]] |
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*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
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*[[Vapor HF Etch]] |
*[[Vapor HF Etch]] |
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* |
*[[Wet Benches]] |
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**[[Solvent Cleaning Benches]] |
**[[Solvent Cleaning Benches]] |
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**[[Spin Coat Benches]] |
**[[Spin Coat Benches]] |
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**[[Plating Bench]] |
**[[Plating Bench]] |
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* |
*[[Gold Plating Bench]] |
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* |
*[[Critical Point Dryer]] |
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* |
*[[Spin Rinse Dryer (SemiTool)]] |
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* |
*[[Chemical-Mechanical Polisher (Logitech)]] |
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|- |
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* |
*[[Rapid Thermal Processor (AET RX6)|Rapid Thermal Annealer/Processor "RTA" (AET RX6)]] |
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* |
*[[Rapid Thermal Processor (SSI Solaris 150)]] |
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* |
*[[Tube Furnace (Tystar 8300)]] |
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* |
*[[Tube Furnace Wafer Bonding (Thermco)]] |
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* |
*[[Tube Furnace AlGaAs Oxidation (Lindberg)]] |
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* |
*[[Wafer Bonder (SUSS SB6-8E)]] |
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* |
*[[Wafer Bonder (Logitech WBS7)|Wafer Bonder/Wax Mounting (Logitech WBS2)]] |
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* |
*[[Ovens - Overview of All Lab Ovens|Ovens - Overview of all Lab Ovens]] |
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** |
**[[Ovens 1, 2 & 3 (Labline)]] |
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** |
**[[Oven 4 (Thermo-Fisher HeraTherm)]] |
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** |
**[[Oven 5 (Labline)]] |
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** |
**[[Vacuum Oven (YES)]] |
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** |
**[[High Temp Oven (Blue M)]] |
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=Packaging= |
=Packaging= |
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* [[Dicing Saw (ADT)]] |
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* |
*[[Dicing Saw (ADT)]] |
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*[[Flip-Chip Bonder (Finetech)]] |
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* [[Vacuum Sealer]] |
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* |
*[[Vacuum Sealer]] |
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*[[Wire Saw (Takatori)]] |
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=Inspection, Test and Characterization= |
=Inspection, Test and Characterization= |
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===== |
=====Optical/Electron Microscopy===== |
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* [[Microscopes|Optical Microscopes]] |
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* [[Fluorescence Microscope (Olympus MX51)]] |
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* [[Deep UV Optical Microscope (Olympus)]] |
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* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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* [[Photo-emission & IR Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]] |
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* [[Field Emission SEM 1 (FEI Sirion)]] |
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* [[Field Emission SEM 2 (JEOL 7600F)]] |
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* [[SEM Sample Coater (Hummer)]] |
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*[[Microscopes|Optical Microscopes]] |
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===== Topographical Metrology ===== |
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* |
*[[Fluorescence Microscope (Olympus MX51)]] |
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*[[Deep UV Optical Microscope (Olympus)]] |
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* [[Step Profilometer (Dektak 6M)]] |
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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* [[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
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*[[Photo-emission & IR Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]] |
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* [[Surface Analysis (KLA/Tencor Surfscan)]] |
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*[[Field Emission SEM 1 (FEI Sirion)]] |
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** ''Sub-micron Particle Counter'' |
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* |
*[[Field Emission SEM 2 (JEOL 7600F)]] |
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*[[SEM Sample Coater (Hummer)]] |
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* [[Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D)]] |
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=====Topographical Metrology===== |
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*[[Step Profilometer (KLA Tencor P-7)]] |
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*[[Step Profilometer (Dektak 6M)]] |
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*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
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*[[Surface Analysis (KLA/Tencor Surfscan)]] |
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**''Sub-micron Particle Counter'' |
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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*[[Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D)]] |
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===== |
=====Thin-Film Analysis/Measurement===== |
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* [[Ellipsometer (Woollam)]] |
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* |
*[[Ellipsometer (Woollam)]] |
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*[[Film Stress (Tencor Flexus)]] |
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* [[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]] |
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* |
*[[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]] |
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* |
*[[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]] |
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* |
*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)]] |
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*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]] |
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* [[Optical Film Thickness (Nanometric)]] |
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*[[Optical Film Thickness (Nanometric)]] |
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* [[Resistivity Mapper (CDE RESMAP)]] |
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*[[Resistivity Mapper (CDE RESMAP)]] |
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=====Other Tools===== |
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*[[Probe Station & Curve Tracer]] |
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===== Other Tools ===== |
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*[[Goniometer]] |
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* [[Probe Station & Curve Tracer]] |
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*[[Photoluminescence PL Setup (Custom)]] |
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* [[Goniometer]] |
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* [[Photoluminescence PL Setup (Custom)]] |
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Revision as of 16:40, 25 September 2019
Lithography
Photoresists and Lithography Chemicals
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
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Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)
Etch Monitoring
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ICP-RIE
Other Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.