Tool List: Difference between revisions
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(→Inspection, Test and Characterization: link for Filmetrics profilm3D) |
m (→Topographical Metrology: Profilm3D new URL) |
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** ''Sub-micron Particle Counter'' |
** ''Sub-micron Particle Counter'' |
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* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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* [[White-Light/Phase-Shift Interference |
* [[Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D)]] |
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| width="400" | |
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===== Thin-Film Analysis/Measurement ===== |
===== Thin-Film Analysis/Measurement ===== |
Revision as of 18:37, 6 February 2019
Lithography
You can see our available photoresists on the Chemical Datasheets page.
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
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Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)
Etch Monitoring
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ICP-RIE
Other Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.