Tool List: Difference between revisions
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m (→Topographical Metrology: Profilm3D new URL) |
m (→Inspection, Test and Characterization: QFI added "thermal") |
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* [[Deep UV Optical Microscope (Olympus)]] |
* [[Deep UV Optical Microscope (Olympus)]] |
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* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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* [[Photo-emission & IR Microscope (QFI)]] |
* [[Photo-emission & IR Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]] |
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===== Topographical Metrology ===== |
===== Topographical Metrology ===== |
Revision as of 02:00, 22 March 2019
Lithography
You can see our available photoresists on the Chemical Datasheets page.
Contact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
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Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)
Etch Monitoring
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ICP-RIE
Other Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.