Tool List: Difference between revisions
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(→Inspection, Test and Characterization: deleted Filmetrics Profilm3D link) |
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*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
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*[[Vapor HF Etch]] |
*[[Vapor HF Etch]] |
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**''Sub-micron Particle Counter'' |
**''Sub-micron Particle Counter'' |
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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*[[Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D)]] |
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=====Thin-Film Analysis/Measurement===== |
=====Thin-Film Analysis/Measurement===== |
Revision as of 02:01, 26 February 2020
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
|
Vacuum Deposition
Physical Vapor Deposition (PVD)
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and Cleaning
Etch Monitoring
|
ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.