Tool List: Difference between revisions

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m (→‎Vacuum Deposition: minor speling)
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=Lithography=
=Lithography=
{|
{|
|-valign="top"
|- valign="top"
|width=300|
| width="300" |
* [[Suss Aligners (SUSS MJB-3)]]
* [[Suss Aligners (SUSS MJB-3)]]
* [[IR Aligner (SUSS MJB-3 IR)]]
* [[IR Aligner (SUSS MJB-3 IR)]]
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* [[Vacuum Oven (YES)]]
* [[Vacuum Oven (YES)]]
* [[Holographic Lith/PL Setup (Custom)]]
* [[Holographic Lith/PL Setup (Custom)]]
|width=400|
| width="400" |
* [[Stepper 1 (GCA 6300)]]
* [[Stepper 1 (GCA 6300)]]
* [[Stepper 2 (AutoStep 200)]]
* [[Stepper 2 (AutoStep 200)]]
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*[[Ion Beam Deposition (Veeco NEXUS)]]
*[[Ion Beam Deposition (Veeco NEXUS)]]
*[[Molecular Vapor Deposition]]
*[[Molecular Vapor Deposition]]
*[[Atomic Layer Deposision (Oxford FlexAL)]]
*[[Atomic Layer Deposision (Oxford FlexAL)|Atomic Layer Deposition (Oxford FlexAL)]]


|}
|}
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=Wet Processing=
=Wet Processing=
{|
{|
|-valign="top"
|- valign="top"
|width=300|
| width="300" |
* [[Wet Benches]]
* [[Wet Benches]]
**[[Solvent Cleaning Benches]]
**[[Solvent Cleaning Benches]]
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**[[HF/TMAH Processing Benches]]
**[[HF/TMAH Processing Benches]]
**[[Plating Bench]]
**[[Plating Bench]]
|width=400|
| width="400" |
* [[Gold Plating Bench]]
* [[Gold Plating Bench]]
* [[Critical Point Dryer]]
* [[Critical Point Dryer]]
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=Inspection, Test and Characterization=
=Inspection, Test and Characterization=
{|
{|
|-valign="top"
|- valign="top"
|width=300|
| width="300" |
* [[Field Emission SEM 1 (FEI Sirion)]]
* [[Field Emission SEM 1 (FEI Sirion)]]
* [[Field Emission SEM 2 (JEOL 7600F)]]
* [[Field Emission SEM 2 (JEOL 7600F)]]
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* [[Optical Film Thickness (Nanometric)]]
* [[Optical Film Thickness (Nanometric)]]
* [[Goniometer]]
* [[Goniometer]]
|width=400|
| width="400" |
* [[Film Stress (Tencor Flexus)]]
* [[Film Stress (Tencor Flexus)]]
* [[SEM Sample Coater (Hummer)]]
* [[SEM Sample Coater (Hummer)]]

Revision as of 17:58, 15 November 2017

Lithography

Vacuum Deposition

Dry Etch

Wet Processing

Thermal Processing

Packaging

Inspection, Test and Characterization