Tool List: Difference between revisions
Jump to navigation
Jump to search
(→Thermal Evaporation: Added EBeam 5 (plasys) link to new page) |
|||
Line 215: | Line 215: | ||
*[[Step Profilometer (KLA Tencor P-7)]] |
*[[Step Profilometer (KLA Tencor P-7)]] |
||
*[[Step Profilometer ( |
*[[Step Profilometer (DektakXT)]] |
||
*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
||
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
||
| width="400" | |
| width="400" | |
||
=====Thin-Film/Material Analysis===== |
=====Thin-Film/Material Analysis===== |
||
Revision as of 23:36, 25 January 2023
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Direct-Write Lithography
Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
|
Vacuum Deposition
Physical Vapor Deposition (PVD)Thermal Evaporation
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and CleaningEtch Monitoring
|
ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
Packaging
Die Singulation / Down-sizingOther Packaging |
Wafer/Die Bonding |
Inspection, Test and Characterization
Optical Microscopy
Electron MicroscopyTopographical Metrology |
Thin-Film/Material AnalysisThickness + Optical Constants
Electrical Analysis
Other Properties |