Tool List: Difference between revisions

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ICP-RIE: removed Unaxis Etch, renamed Fluorine Etcher
Lithography: deleted Stepper 1
 
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__NOTOC__
__NOTOC__
{| class="wikitable" style="width:min-content;"
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=== Tool Categories ===

* [[:Category:Lithography|Lithography]]
* [[:Category:Vacuum Deposition|Deposition]]
* [[:Category:Dry Etch|Dry Etch]]
* [[:Category:Wet Processing|Wet Process]]
* [[:Category:Thermal Processing|Thermal Process]]
* [[:Category:Packaging|Packaging/Bonding]]
* [[Tool List#Measurement .26 Characterization|Metrology/Test]]
|}

=Lithography=
=Lithography=


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=====Direct-Write Lithography=====
=====Direct-Write Lithography=====


*[[E-Beam Lithography System (JEOL JBX-6300FS)]]
*[[E-Beam Lithography System (Raith EBPG 5150+)]]
*[[SEM 1 (JEOL IT800SHL)|E-Beam Lithography (Nabity v9)]]
*[[SEM 1 (JEOL IT800SHL)|E-Beam Lithography (Nabity v9)]]
*[[Focused Ion-Beam Lithography (Raith Velion)]]
*[[Focused Ion-Beam Lithography (Raith Velion)]]
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=====Steppers (Optical Exposure)=====
=====Steppers (Optical Exposure)=====


*[[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]]
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]]
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]]
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]]
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]]
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*[[RIE 2 (MRC)]]
*[[RIE 2 (MRC)]]
*[[RIE 3 (MRC)]]
*[[RIE 5 (PlasmaTherm)]]
*[[RIE 5 (PlasmaTherm)]]


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=====ICP-RIE=====
=====ICP-RIE=====


*[[ICP Etch 1 (Panasonic E646V)]]
*[[ICP Etch 2 (Panasonic E626I)]]
*[[ICP Etch 2 (Panasonic E626I)]]
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]]
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]]
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**[[Plating Bench]]
**[[Plating Bench]]
| width="400" |
| width="400" |
*[[Gold Plating Bench]]
*[[Gold Plating Bench]] (Semcon)
*[[Critical Point Dryer]]
*[[Spin Rinse Dryer (SemiTool)]]
*[[Spin Rinse Dryer (SemiTool)]]
*[[Chemical-Mechanical Polisher (Logitech)]]
*[[Chemical-Mechanical Polisher (Logitech)]]
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======Electrical Analysis======
======Electrical Analysis======


*[[Resistivity Mapper (CDE RESMAP)]]
*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]]
*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]]
*[[Resistivity Mapper (CDE RESMAP)]]
*[[IR Thermal Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]]
*[[IR Thermal Microscope (QFI)|Thermal HotSpot IR Microscope (QFI)]]


======Other Properties======
======Other Properties======
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== [[Decomissioned Tools]] ==
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.

Latest revision as of 18:22, 1 June 2026

Tool Categories

Lithography

Photoresists and Lithography Chemicals
Contact Aligners (Optical Exposure)
Direct-Write Lithography
Other Patterning Systems
Steppers (Optical Exposure)
Thermal Processing for Photolithography
Lithography Support

Vacuum Deposition

Physical Vapor Deposition (PVD)

Thermal Evaporation
Sputter Deposition
Chemical Vapor Deposition (CVD)

Dry Etch

Reactive Ion Etching (RIE)
Plasma Etching and Cleaning
Etch Monitoring
ICP-RIE
Ion Milling and Reactive Ion Beam Etching
Other Dry Etching

Wet Processing

See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.

Thermal Processing

Packaging

Back-end Fabrication Tools

Die Singulation / Down-sizing

Other Packaging

Wafer/Die Bonding

Measurement & Characterization

Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools

Optical Microscopy
Electron Microscopy
Topographical Metrology
Thin-Film/Material Analysis
Thickness + Optical Constants
Electrical Analysis
Other Properties

Decomissioned Tools

Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.