Tool List: Difference between revisions

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Wet Processing: deletec critical point dryer, added "semcon" to gold plating name
Lithography: deleted Stepper 1
 
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__NOTOC__
__NOTOC__
{| class="wikitable" style="width:min-content;"
|
=== Tool Categories ===

* [[:Category:Lithography|Lithography]]
* [[:Category:Vacuum Deposition|Deposition]]
* [[:Category:Dry Etch|Dry Etch]]
* [[:Category:Wet Processing|Wet Process]]
* [[:Category:Thermal Processing|Thermal Process]]
* [[:Category:Packaging|Packaging/Bonding]]
* [[Tool List#Measurement .26 Characterization|Metrology/Test]]
|}

=Lithography=
=Lithography=


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=====Steppers (Optical Exposure)=====
=====Steppers (Optical Exposure)=====


*[[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]]
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]]
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]]
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]]
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]]
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=====ICP-RIE=====
=====ICP-RIE=====


*[[ICP Etch 1 (Panasonic E646V)]]
*[[ICP Etch 2 (Panasonic E626I)]]
*[[ICP Etch 2 (Panasonic E626I)]]
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]]
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]]

Latest revision as of 18:22, 1 June 2026

Tool Categories

Lithography

Photoresists and Lithography Chemicals
Contact Aligners (Optical Exposure)
Direct-Write Lithography
Other Patterning Systems
Steppers (Optical Exposure)
Thermal Processing for Photolithography
Lithography Support

Vacuum Deposition

Physical Vapor Deposition (PVD)

Thermal Evaporation
Sputter Deposition
Chemical Vapor Deposition (CVD)

Dry Etch

Reactive Ion Etching (RIE)
Plasma Etching and Cleaning
Etch Monitoring
ICP-RIE
Ion Milling and Reactive Ion Beam Etching
Other Dry Etching

Wet Processing

See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.

Thermal Processing

Packaging

Back-end Fabrication Tools

Die Singulation / Down-sizing

Other Packaging

Wafer/Die Bonding

Measurement & Characterization

Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools

Optical Microscopy
Electron Microscopy
Topographical Metrology
Thin-Film/Material Analysis
Thickness + Optical Constants
Electrical Analysis
Other Properties

Decomissioned Tools

Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.