Tool List: Difference between revisions
Jump to navigation
Jump to search
(→ICP-RIE: link to SLR Fluorine Etcher) |
(Made a "Decomissioned tools" section) |
||
(79 intermediate revisions by 9 users not shown) | |||
Line 1: | Line 1: | ||
__NOTOC__ |
__NOTOC__ |
||
=Lithography= |
=Lithography= |
||
You can see our available photoresists on the [https://www.nanotech.ucsb.edu/wiki/index.php/Lithography_Recipes#Chemical_Datasheets Chemical Datasheets page]. |
|||
{| |
{| |
||
|- valign="top" |
|- valign="top" |
||
| width="300" | |
| width="300" | |
||
=====Photoresists and Lithography Chemicals===== |
|||
===== Contact Aligners (Optical Exposure) ===== |
|||
* [[Suss Aligners (SUSS MJB-3)]] |
|||
* [[IR Aligner (SUSS MJB-3 IR)]] |
|||
* [[Contact Aligner (SUSS MA-6)]] |
|||
* [[DUV Flood Expose]] |
|||
*See the [https://wiki.nanotech.ucsb.edu/w/index.php?title=Lithography_Recipes#Chemicals_Stocked_.2B_Datasheets Chemical Datasheets page]. |
|||
===== Other Patterning Systems ===== |
|||
* |
*[[Automated Coat/Develop System (S-Cubed Flexi)|Auto. Coat/Develop (S-Cubed Flexi)]] |
||
* [[Nano-Imprint (Nanonex NX2000)]] |
|||
=====Contact Aligners (Optical Exposure)===== |
|||
* [[Holographic Lith/PL Setup (Custom)|Holographic Litho/PL Setup (Custom)]] |
|||
*[[Suss Aligners (SUSS MJB-3)|Contact Aligners (SUSS MJB-3)]] |
|||
*[[Contact Aligner (SUSS MA-6)]] |
|||
*[[DUV Flood Expose]] |
|||
=====Direct-Write Lithography===== |
|||
*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
|||
*[[SEM 1 (JEOL IT800SHL)|E-Beam Lithography (Nabity v9)]] |
|||
*[[Focused Ion-Beam Lithography (Raith Velion)]] |
|||
*[[Maskless Aligner (Heidelberg MLA150)]] |
|||
=====Other Patterning Systems===== |
|||
*[[Holographic Lith/PL Setup (Custom)|Holographic Litho/PL Setup (Custom)]] |
|||
| width="400" | |
| width="400" | |
||
===== |
=====Steppers (Optical Exposure)===== |
||
* [[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]] |
|||
* |
*[[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]] |
||
* |
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]] |
||
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]] |
|||
=====Thermal Processing for Photolithography===== |
|||
*[[Ovens - Overview of All Lab Ovens|Ovens - Overview of all lab ovens]] |
|||
*[[Ovens 1, 2 & 3 (Labline)]] |
|||
*[[Oven 4 (Fisher)]] |
|||
*[[Oven 5 (Labline)]] |
|||
*[[High Temp Oven (Blue M)]] |
|||
=====Lithography Support===== |
|||
*The [https://wiki.nanotech.ucsb.edu/w/index.php?title=Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes. |
|||
===== Thermal Processing for Photolithography ===== |
|||
*[https://signupmonkey.ece.ucsb.edu/w/index.php?title=Wet_Benches#Automated_Wet-processing_Spinners_.28POLOS.29 POLOS spinners] on Develop and Solvent benches |
|||
* [[Ovens 1, 2 & 3 (Labline)]] |
|||
*[[Spin Rinse Dryer (SemiTool)|Spin/Rinse/Dryer]] |
|||
* [[Oven 4 (Fisher)]] |
|||
* [[Oven 5 (Labline)]] |
|||
* [[High Temp Oven (Blue M)]] |
|||
* [[Vacuum Oven (YES)]] |
|||
* The [https://www.nanotech.ucsb.edu/wiki/index.php/Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes. |
|||
|- |
|- |
||
|} |
|} |
||
= |
=Vacuum Deposition= |
||
{| |
{| |
||
|- valign="top" |
|- valign="top" |
||
| width="300" | |
| width="300" | |
||
==== |
====Physical Vapor Deposition (PVD)==== |
||
*[[E-Beam 1 (Sharon)]] |
|||
*[[E-Beam 2 (Custom)]] |
|||
*[[E-Beam 3 (Temescal)]] |
|||
*[[E-Beam 4 (CHA)]] |
|||
*[[Thermal Evap 1]] |
|||
*[[Thermal Evap 2 (Solder)]] |
|||
===== |
=====Thermal Evaporation===== |
||
*[[Sputter 3 (AJA ATC 2000-F)]] |
|||
*[[ |
*[[E-Beam 1 (Sharon)]] |
||
*[[E-Beam 2 (Custom)]] |
|||
*[[E-Beam 3 (Temescal)]] |
|||
*[[E-Beam 4 (CHA)]] |
|||
*[[E-Beam 5 (Plasys)]] |
|||
*[[Thermal Evap 1]] |
|||
*[[Thermal Evap 2 (Solder)]] |
|||
=====Sputter Deposition===== |
|||
*[[Sputter 3 (AJA ATC 2000-F)]] |
|||
*[[Sputter 4 (AJA ATC 2200-V)]] |
|||
*[[Sputter 5 (AJA ATC 2200-V)]] |
*[[Sputter 5 (AJA ATC 2200-V)]] |
||
*[[Ion Beam Deposition (Veeco NEXUS)]] |
*[[Ion Beam Deposition (Veeco NEXUS)]] |
||
*[[SEM Sample Coater (Hummer)]] |
|||
| width="400" | |
| width="400" | |
||
===== |
=====Chemical Vapor Deposition (CVD)===== |
||
*[[PECVD 1 (PlasmaTherm 790)]] |
|||
*[[PECVD |
*[[PECVD 1 (PlasmaTherm 790)]] |
||
*[[ |
*[[PECVD 2 (Advanced Vacuum)]] |
||
*[[ |
*[[ICP-PECVD (Unaxis VLR)]] |
||
*[[Molecular Vapor Deposition]] |
|||
*[[Atomic Layer Deposision (Oxford FlexAL)|Atomic Layer Deposition (Oxford FlexAL)]] |
*[[Atomic Layer Deposision (Oxford FlexAL)|Atomic Layer Deposition (Oxford FlexAL)]] |
||
|} |
|} |
||
= |
=Dry Etch= |
||
{| |
{| |
||
|- valign="top" |
|- valign="top" |
||
| width="300" | |
| width="300" | |
||
===== |
=====Reactive Ion Etching (RIE)===== |
||
*[[RIE 2 (MRC)]] |
|||
*[[RIE |
*[[RIE 2 (MRC)]] |
||
*[[RIE 5 (PlasmaTherm)]] |
*[[RIE 5 (PlasmaTherm)]] |
||
*[[Ashers (Technics PEII)]] |
|||
=====Plasma Etching and Cleaning===== |
|||
*[[Plasma Clean (Gasonics 2000)]] |
|||
*[[Plasma Activation (EVG 810)]] |
|||
*[[ |
*[[Plasma Clean (YES EcoClean)]] |
||
*[[Plasma Activation (EVG 810)]] |
|||
*[[Ashers (Technics PEII)]] |
|||
=====Etch Monitoring===== |
|||
*[[Laser Etch Monitoring]] (Endpoint Detection) |
|||
*Optical Emission Spectra |
|||
*Residual Gas Analyzer (RGA) |
|||
| width="400" | |
| width="400" | |
||
===== |
=====ICP-RIE===== |
||
*[[ICP Etch 1 (Panasonic E626I)]] |
|||
*[[ICP Etch |
*[[ICP Etch 1 (Panasonic E646V)]] |
||
*[[ICP |
*[[ICP Etch 2 (Panasonic E626I)]] |
||
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]] |
|||
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Plasma-Therm SLR: Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
|||
*[[ |
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
||
*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
|||
=====Ion Milling and Reactive Ion Beam Etching===== |
|||
*[[CAIBE (Oxford Ion Mill)]] |
|||
*[[Focused Ion-Beam Lithography (Raith Velion)]] |
|||
=====Other Dry Etching===== |
|||
*[[UV Ozone Reactor]] |
|||
===== Other Dry Etching ===== |
|||
*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
|||
*[[UV Ozone Reactor]] |
|||
*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]] |
|||
*[[Vapor HF Etch]] |
*[[Vapor HF Etch]] |
||
Line 93: | Line 133: | ||
|- valign="top" |
|- valign="top" |
||
| width="300" | |
| width="300" | |
||
* |
*[[Wet Benches]] |
||
**[[Solvent Cleaning Benches]] |
**[[Solvent Cleaning Benches]] |
||
**[[Spin Coat Benches]] |
**[[Spin Coat Benches]] |
||
**[[Develop Benches]] |
**[[Develop Benches]] |
||
**[[Toxic Corrosive Benches]] |
**[[Toxic Corrosive Benches]] |
||
**[[Wet Benches#Wafer Toxic Corrosive Benches|Wafer Toxic Corrosive Bench]] |
|||
**[[HF/TMAH Processing Benches]] |
**[[HF/TMAH Processing Benches]] |
||
**[[Plating Bench]] |
**[[Plating Bench]] |
||
| width="400" | |
| width="400" | |
||
* |
*[[Gold Plating Bench]] |
||
* |
*[[Critical Point Dryer]] |
||
* |
*[[Spin Rinse Dryer (SemiTool)]] |
||
* |
*[[Chemical-Mechanical Polisher (Logitech)]] |
||
*[[Mechanical Polisher (Allied)]] |
|||
*[[Automated Coat/Develop System (S-Cubed Flexi)|Auto. Coat/Develop (S-Cubed Flexi)]] |
|||
*[https://signupmonkey.ece.ucsb.edu/w/index.php?title=Wet_Benches#Automated_Wet-processing_Spinners_.28POLOS.29 Auto. Wet-Processing Spinners (POLOS)] |
|||
|- |
|- |
||
|} |
|} |
||
Line 112: | Line 156: | ||
|- valign="top" |
|- valign="top" |
||
| width="400" | |
| width="400" | |
||
* |
*[[Rapid Thermal Processor (AET RX6)|Rapid Thermal Annealer/Processor "RTA" (AET RX6)]] |
||
*[[Rapid Thermal Processor (SSI Solaris 150)]] |
|||
* [[Strip Annealer]] |
|||
* |
*[[Tube Furnace (Tystar 8300)]] |
||
* |
*[[Tube Furnace Wafer Bonding (Thermco)]] |
||
* |
*[[Tube Furnace AlGaAs Oxidation (Lindberg)]] |
||
*[[Wafer Bonder (SUSS SB6-8E)]] |
|||
* [[Tube Furnace AlGaAs Oxidation (Linberg)]] |
|||
*[[Wafer Bonder (Logitech WBS7)|Wafer Bonder/Wax Mounting (Logitech WBS2)]] |
|||
| width="400" | |
| width="400" | |
||
* |
*[[Ovens - Overview of All Lab Ovens|Ovens - Overview of all Lab Ovens]] |
||
* |
**[[Ovens 1, 2 & 3 (Labline)]] |
||
* |
**[[Oven 4 (Thermo-Fisher HeraTherm)]] |
||
* |
**[[Oven 5 (Labline)]] |
||
* |
**[[High Temp Oven (Blue M)]] |
||
* [[Wafer Bonder (Logitech WBS7)|Wafer Bonder/Wax Mounting (Logitech WBS2)]] |
|||
|- |
|- |
||
|} |
|} |
||
=Packaging= |
=Packaging= |
||
''Back-end Fabrication Tools'' |
|||
* [[Dicing Saw (ADT)]] |
|||
{| |
|||
* [[Flip-Chip Bonder (Finetech)]] |
|||
| |
|||
* [[Vacuum Sealer]] |
|||
====Die Singulation / Down-sizing==== |
|||
* [[Wire Saw (Takatori)]] |
|||
*[[Dicing Saw (ADT)]] |
|||
=Inspection, Test and Characterization= |
|||
*[[Wafer Cleaver (PELCO Flip-Scribe)|Manual Wafer Cleaver (PELCO Flipscribe)]] |
|||
*[[Automated Wafer Cleaver (Loomis LSD-155LT)]] |
|||
====Other Packaging==== |
|||
*[[Vacuum Sealer]] |
|||
| |
|||
====Wafer/Die Bonding==== |
|||
*[[Flip-Chip Bonder (Finetech)]] |
|||
*[[Wafer Bonder (SUSS SB6-8E)]] |
|||
*[[Wafer Bonder (Logitech WBS7)|Wafer Bonder/Wax Mounting (Logitech WBS2)]] |
|||
|} |
|||
=Measurement & Characterization= |
|||
''[https://en.wikipedia.org/wiki/Metrology Metrology], Electrical/Optical Testing and Thin-Film/Materials [https://en.wikipedia.org/wiki/Characterization_(materials_science) Characterization] tools'' |
|||
{| |
{| |
||
|- valign="top" |
|- valign="top" |
||
| width="300" | |
| width="300" | |
||
===== |
=====Optical Microscopy===== |
||
* [[Field Emission SEM 1 (FEI Sirion)]] |
|||
* [[Field Emission SEM 2 (JEOL 7600F)]] |
|||
* [[SEM Sample Coater (Hummer)]] |
|||
* [[Microscopes|Optical Microscopes]] |
|||
* [[Fluorescence Microscope (Olympus MX51)]] |
|||
* [[Deep UV Optical Microscope (Olympus)]] |
|||
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
|||
* [[Photo-emission & IR Microscope (QFI)]] |
|||
*[[Microscopes|Optical Microscopes]] - ''General Use'' |
|||
===== Topographical Metrology ===== |
|||
* |
*[[Fluorescence Microscope (Olympus MX51)]] |
||
*[[Deep UV Optical Microscope (Olympus)]] |
|||
* [[Step Profilometer (Dektak 6M)]] |
|||
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
|||
* [[Atomic Force Microsope (Dimension 3100/Nanoscope IVA)]] |
|||
*[[Digital Microscope (Olympus DSX1000)|Digital Microscope #7 (Olympus DSX1000)]] |
|||
* [[Surface Analysis (KLA/Tencor Surfscan)]] |
|||
*[[Suss Aligners (SUSS MJB-3)#Backside Alignment|Near-IR Inspection Scope (MJB-IR)]] |
|||
** ''Sub-micron Particle Counter'' |
|||
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
|||
=====Electron Microscopy===== |
|||
*[[SEM 1 (JEOL IT800SHL)]] |
|||
*[[Field Emission SEM 2 (JEOL IT800SHL)|SEM 2 (JEOL IT800SHL) w/ EDAX]] |
|||
*[[SEM Sample Coater (Hummer)]] |
|||
=====Topographical Metrology===== |
|||
*[[Step Profilometer (KLA Tencor P-7)]] |
|||
*[[Step Profilometer (DektakXT)]] |
|||
*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
|||
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
|||
| width="400" | |
| width="400" | |
||
===== Thin-Film Analysis/Measurement ===== |
|||
* [[Ellipsometer (Woollam)]] |
|||
* [[Ellipsometer (Rudolph)]] |
|||
* [[Film Stress (Tencor Flexus)]] |
|||
* [[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]] |
|||
* [[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]] |
|||
* [[Optical Film Thickness (Nanometric)]] |
|||
* [[Resistivity Mapper (CDE RESMAP)]] |
|||
===== |
=====Thin-Film/Material Analysis===== |
||
* [[Probe Station & Curve Tracer]] |
|||
======Thickness + Optical Constants====== |
|||
* [[Goniometer]] |
|||
* [[Photoluminescence PL Setup (Custom)]] |
|||
*[[Ellipsometer (Woollam)]] |
|||
*[[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]] |
|||
*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)]] |
|||
*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]] |
|||
======Electrical Analysis====== |
|||
*[[Resistivity Mapper (CDE RESMAP)]] |
|||
*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]] |
|||
*[[IR Thermal Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]] |
|||
======Other Properties====== |
|||
*[[Film Stress (Tencor Flexus)]] |
|||
*[[Surface Analysis (KLA/Tencor Surfscan)|Particle Counts (KLA/Tencor Surfscan)]] |
|||
*[[Photoluminescence PL Setup (Custom)]] |
|||
|- |
|- |
||
|} |
|} |
||
== [[Decomissioned Tools]] == |
|||
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes. |
Latest revision as of 22:28, 6 August 2024
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Direct-Write Lithography
Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
|
Vacuum Deposition
Physical Vapor Deposition (PVD)Thermal Evaporation
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and CleaningEtch Monitoring
|
ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
Packaging
Back-end Fabrication Tools
Die Singulation / Down-sizingOther Packaging |
Wafer/Die Bonding |
Measurement & Characterization
Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools
Optical Microscopy
Electron MicroscopyTopographical Metrology |
Thin-Film/Material AnalysisThickness + Optical Constants
Electrical Analysis
Other Properties |
Decomissioned Tools
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.