Tool List: Difference between revisions
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=====Contact Aligners (Optical Exposure)===== |
=====Contact Aligners (Optical Exposure)===== |
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*[[Suss Aligners (SUSS MJB-3)]] |
*[[Suss Aligners (SUSS MJB-3)|Contact Aligners (SUSS MJB-3)]] |
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*[[Contact Aligner (SUSS MA-6)]] |
*[[Contact Aligner (SUSS MA-6)]] |
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*[[DUV Flood Expose]] |
*[[DUV Flood Expose]] |
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*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
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*[[ |
*[[SEM 1 (JEOL IT800SHL)|E-Beam Lithography (Nabity v9)]] |
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*[[Focused Ion-Beam Lithography (Raith Velion)]] |
*[[Focused Ion-Beam Lithography (Raith Velion)]] |
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*[[Maskless Aligner (Heidelberg MLA150)]] |
*[[Maskless Aligner (Heidelberg MLA150)]] |
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*[[Oven 5 (Labline)]] |
*[[Oven 5 (Labline)]] |
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*[[High Temp Oven (Blue M)]] |
*[[High Temp Oven (Blue M)]] |
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*[[Vacuum Oven (YES)]] |
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=====Lithography Support===== |
=====Lithography Support===== |
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*[[E-Beam 3 (Temescal)]] |
*[[E-Beam 3 (Temescal)]] |
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*[[E-Beam 4 (CHA)]] |
*[[E-Beam 4 (CHA)]] |
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*[[Thermal Evap 1]] |
*[[Thermal Evap 1]] |
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*[[Thermal Evap 2 (Solder)]] |
*[[Thermal Evap 2 (Solder)]] |
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*[[RIE 2 (MRC)]] |
*[[RIE 2 (MRC)]] |
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*[[RIE 5 (PlasmaTherm)]] |
*[[RIE 5 (PlasmaTherm)]] |
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=====ICP-RIE===== |
=====ICP-RIE===== |
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*[[ICP Etch 1 (Panasonic |
*[[ICP Etch 1 (Panasonic E646V)]] |
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*[[ICP Etch 2 (Panasonic |
*[[ICP Etch 2 (Panasonic E626I)]] |
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*[[ICP-Etch (Unaxis VLR)]] |
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*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]] |
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]] |
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*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)| |
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
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*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
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**[[Develop Benches]] |
**[[Develop Benches]] |
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**[[Toxic Corrosive Benches]] |
**[[Toxic Corrosive Benches]] |
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**[[Wet Benches#Wafer Toxic Corrosive Benches|Wafer Toxic Corrosive Bench]] |
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**[[HF/TMAH Processing Benches]] |
**[[HF/TMAH Processing Benches]] |
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**[[Plating Bench]] |
**[[Plating Bench]] |
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=Packaging= |
=Packaging= |
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''Back-end Fabrication Tools'' |
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{| |
{| |
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*[[Dicing Saw (ADT)]] |
*[[Dicing Saw (ADT)]] |
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*[[Wafer Cleaver (PELCO Flip-Scribe)|Wafer Cleaver (PELCO Flipscribe)]] |
*[[Wafer Cleaver (PELCO Flip-Scribe)|Manual Wafer Cleaver (PELCO Flipscribe)]] |
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*[[Automated Wafer Cleaver (Loomis LSD-155LT)]] |
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====Other Packaging==== |
====Other Packaging==== |
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= |
=Measurement & Characterization= |
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''[https://en.wikipedia.org/wiki/Metrology Metrology], Electrical/Optical Testing and Thin-Film/Materials [https://en.wikipedia.org/wiki/Characterization_(materials_science) Characterization] tools'' |
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{| |
{| |
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|- valign="top" |
|- valign="top" |
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*[[Deep UV Optical Microscope (Olympus)]] |
*[[Deep UV Optical Microscope (Olympus)]] |
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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*[[Digital Microscope (Olympus DSX1000)|Digital Microscope #7 (Olympus DSX1000)]] |
*[[Digital Microscope (Olympus DSX1000)|Digital Microscope #7 (Olympus DSX1000)]] |
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*[[Suss Aligners (SUSS MJB-3)#Backside Alignment|Near-IR Inspection Scope (MJB-IR)]] |
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=====Electron Microscopy===== |
=====Electron Microscopy===== |
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*[[ |
*[[SEM 1 (JEOL IT800SHL)]] |
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*[[Field Emission SEM 2 (JEOL |
*[[Field Emission SEM 2 (JEOL IT800SHL)|SEM 2 (JEOL IT800SHL) w/ EDAX]] |
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*[[SEM Sample Coater (Hummer)]] |
*[[SEM Sample Coater (Hummer)]] |
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*[[Step Profilometer (KLA Tencor P-7)]] |
*[[Step Profilometer (KLA Tencor P-7)]] |
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*[[Step Profilometer ( |
*[[Step Profilometer (DektakXT)]] |
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*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
*[[Atomic Force Microscope (Bruker ICON)|Atomic Force Microsope (Bruker ICON)]] |
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
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| width="400" | |
| width="400" | |
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=====Thin-Film/Material Analysis===== |
=====Thin-Film/Material Analysis===== |
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*[[Resistivity Mapper (CDE RESMAP)]] |
*[[Resistivity Mapper (CDE RESMAP)]] |
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*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]] |
*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]] |
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======Other Properties====== |
======Other Properties====== |
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*[[Surface Analysis (KLA/Tencor Surfscan)|Particle Counts (KLA/Tencor Surfscan)]] |
*[[Surface Analysis (KLA/Tencor Surfscan)|Particle Counts (KLA/Tencor Surfscan)]] |
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*[[Photoluminescence PL Setup (Custom)]] |
*[[Photoluminescence PL Setup (Custom)]] |
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*[[Goniometer (Rame-Hart A-100)|Goniometer (Ramé-Hart A-100)]] |
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**''Surface hydrophobicity'' |
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== [[Decomissioned Tools]] == |
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Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes. |
Latest revision as of 22:28, 6 August 2024
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Direct-Write Lithography
Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
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Vacuum Deposition
Physical Vapor Deposition (PVD)Thermal Evaporation
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and CleaningEtch Monitoring
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ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
Packaging
Back-end Fabrication Tools
Die Singulation / Down-sizingOther Packaging |
Wafer/Die Bonding |
Measurement & Characterization
Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools
Optical Microscopy
Electron MicroscopyTopographical Metrology |
Thin-Film/Material AnalysisThickness + Optical Constants
Electrical Analysis
Other Properties |
Decomissioned Tools
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.