Tool List: Difference between revisions
Jump to navigation
Jump to search
(→Contact Aligners (Optical Exposure): changed "suss aligners" --> "contact aligners") |
(Made a "Decomissioned tools" section) |
||
(9 intermediate revisions by the same user not shown) | |||
Line 19: | Line 19: | ||
*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
*[[E-Beam Lithography System (JEOL JBX-6300FS)]] |
||
*[[ |
*[[SEM 1 (JEOL IT800SHL)|E-Beam Lithography (Nabity v9)]] |
||
*[[Focused Ion-Beam Lithography (Raith Velion)]] |
*[[Focused Ion-Beam Lithography (Raith Velion)]] |
||
*[[Maskless Aligner (Heidelberg MLA150)]] |
*[[Maskless Aligner (Heidelberg MLA150)]] |
||
Line 93: | Line 93: | ||
*[[RIE 2 (MRC)]] |
*[[RIE 2 (MRC)]] |
||
*[[RIE 3 (MRC)]] |
|||
*[[RIE 5 (PlasmaTherm)]] |
*[[RIE 5 (PlasmaTherm)]] |
||
Line 110: | Line 109: | ||
=====ICP-RIE===== |
=====ICP-RIE===== |
||
*[[ICP Etch 1 (Panasonic |
*[[ICP Etch 1 (Panasonic E646V)]] |
||
*[[ICP Etch 2 (Panasonic |
*[[ICP Etch 2 (Panasonic E626I)]] |
||
*[[ICP-Etch (Unaxis VLR)]] |
|||
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]] |
*[[Oxford ICP Etcher (PlasmaPro 100 Cobra)]] |
||
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)| |
*[[Fluorine ICP Etcher (PlasmaTherm/SLR Fluorine ICP)|Fluorine ICP (PlasmaTherm/SLR Fluorine Etcher)]] |
||
*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
*[[DSEIII (PlasmaTherm/Deep Silicon Etcher)|Plasma-Therm DSE-iii (PlasmaTherm/Deep Silicon Etcher)]] |
||
Line 175: | Line 173: | ||
=Packaging= |
=Packaging= |
||
''Back-end Fabrication Tools'' |
|||
{| |
{| |
||
| |
| |
||
Line 195: | Line 194: | ||
|} |
|} |
||
= |
=Measurement & Characterization= |
||
''[https://en.wikipedia.org/wiki/Metrology Metrology], Electrical/Optical Testing and Thin-Film/Materials [https://en.wikipedia.org/wiki/Characterization_(materials_science) Characterization] tools'' |
|||
{| |
{| |
||
|- valign="top" |
|- valign="top" |
||
Line 206: | Line 206: | ||
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]] |
||
*[[Digital Microscope (Olympus DSX1000)|Digital Microscope #7 (Olympus DSX1000)]] |
*[[Digital Microscope (Olympus DSX1000)|Digital Microscope #7 (Olympus DSX1000)]] |
||
*[[Suss Aligners (SUSS MJB-3)#Backside Alignment|Near-IR Inspection Scope (MJB-IR)]] |
|||
=====Electron Microscopy===== |
=====Electron Microscopy===== |
||
*[[ |
*[[SEM 1 (JEOL IT800SHL)]] |
||
*[[Field Emission SEM 2 (JEOL |
*[[Field Emission SEM 2 (JEOL IT800SHL)|SEM 2 (JEOL IT800SHL) w/ EDAX]] |
||
*[[SEM Sample Coater (Hummer)]] |
*[[SEM Sample Coater (Hummer)]] |
||
Line 241: | Line 242: | ||
*[[Surface Analysis (KLA/Tencor Surfscan)|Particle Counts (KLA/Tencor Surfscan)]] |
*[[Surface Analysis (KLA/Tencor Surfscan)|Particle Counts (KLA/Tencor Surfscan)]] |
||
*[[Photoluminescence PL Setup (Custom)]] |
*[[Photoluminescence PL Setup (Custom)]] |
||
*[[Goniometer (Rame-Hart A-100)|Goniometer (Ramé-Hart A-100)]] |
|||
**''Surface hydrophobicity'' |
|||
|- |
|- |
||
|} |
|} |
||
== [[Decomissioned Tools]] == |
|||
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes. |
Latest revision as of 22:28, 6 August 2024
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Direct-Write Lithography
Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
|
Vacuum Deposition
Physical Vapor Deposition (PVD)Thermal Evaporation
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and CleaningEtch Monitoring
|
ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
Packaging
Back-end Fabrication Tools
Die Singulation / Down-sizingOther Packaging |
Wafer/Die Bonding |
Measurement & Characterization
Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools
Optical Microscopy
Electron MicroscopyTopographical Metrology |
Thin-Film/Material AnalysisThickness + Optical Constants
Electrical Analysis
Other Properties |
Decomissioned Tools
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.