Tool List: Difference between revisions
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→Dry Etch: Removed ICP#1 from the list - retiring |
→Lithography: deleted Stepper 1 |
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=====Steppers (Optical Exposure)===== |
=====Steppers (Optical Exposure)===== |
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*[[Stepper 1 (GCA 6300)|Stepper 1 (GCA 6300, i-line)]] |
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*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]] |
*[[Stepper 2 (AutoStep 200)|Stepper 2 (AutoStep 200, i-line)]] |
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*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]] |
*[[Stepper 3 (ASML DUV)|Stepper 3 (ASML DUV, Deep-UV)]] |
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Latest revision as of 18:22, 1 June 2026
Tool Categories |
Lithography
Photoresists and Lithography ChemicalsContact Aligners (Optical Exposure)Direct-Write Lithography
Other Patterning Systems |
Steppers (Optical Exposure)Thermal Processing for Photolithography
Lithography Support
|
Vacuum Deposition
Physical Vapor Deposition (PVD)Thermal Evaporation
Sputter Deposition |
Chemical Vapor Deposition (CVD) |
Dry Etch
Reactive Ion Etching (RIE)Plasma Etching and CleaningEtch Monitoring
|
ICP-RIE
Ion Milling and Reactive Ion Beam EtchingOther Dry Etching |
Wet Processing
See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.
Thermal Processing
Packaging
Back-end Fabrication Tools
Die Singulation / Down-sizingOther Packaging |
Wafer/Die Bonding |
Measurement & Characterization
Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools
Optical Microscopy
Electron MicroscopyTopographical Metrology |
Thin-Film/Material AnalysisThickness + Optical Constants
Electrical Analysis
Other Properties |
Decomissioned Tools
Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.