Tool List: Difference between revisions

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→Lithography: added Raith Picomaster
 
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=====Optical Microscopy=====
==== <big>Inspection</big> ====

=====Microscopes 🔬=====


*[[Microscopes|Optical Microscopes]] - ''General Use''
*[[Microscopes|Optical Microscopes]] - ''General Use''
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*[[Suss Aligners (SUSS MJB-3)#Backside Alignment|Near-IR Inspection Scope (MJB-IR)]]
*[[Suss Aligners (SUSS MJB-3)#Backside Alignment|Near-IR Inspection Scope (MJB-IR)]]


=====Electron Microscopy=====
=====Electron Microscopes 🦠=====


*[[SEM 1 (JEOL IT800SHL)]]
*[[SEM 1 (JEOL IT800SHL)]]
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*[[SEM Sample Coater (Hummer)]]
*[[SEM Sample Coater (Hummer)]]


=====Topographical Metrology=====
=====Topology / Profilometer 🏔️=====


*[[Step Profilometer (KLA Tencor P-7)]]
*[[Step Profilometer (KLA Tencor P-7)]]
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
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==== <big>Thin-Film/Material Analysis</big> ====


=====Thin-Film/Material Analysis=====
======Optical 🔦======

======Thickness + Optical Constants======


*[[Ellipsometer (Woollam)]]
*[[Ellipsometer (Woollam)]]
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*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]]
*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]]


======Electrical Analysis======
======Electrical ⚡️======


*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]]
*[[Probe Station & Curve Tracer|Probe Station & Source/Meter Units]]
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*[[IR Thermal Microscope (QFI)|Thermal HotSpot IR Microscope (QFI)]]
*[[IR Thermal Microscope (QFI)|Thermal HotSpot IR Microscope (QFI)]]


======Other Properties======
======Other 🔍======


*[[Film Stress (Tencor Flexus)]]
*[[Film Stress (Tencor Flexus)]]

Latest revision as of 23:38, 6 November 2026

Tool Categories

Lithography

Photoresists and Lithography Chemicals
Contact Aligners (Optical Exposure)
Direct-Write Lithography
Other Patterning Systems
Steppers (Optical Exposure)
Thermal Processing for Photolithography
Lithography Support

Vacuum Deposition

Physical Vapor Deposition (PVD)

Thermal Evaporation
Sputter Deposition
Chemical Vapor Deposition (CVD)

Dry Etch

Reactive Ion Etching (RIE)
Plasma Etching and Cleaning
Etch Monitoring
ICP-RIE
Ion Milling and Reactive Ion Beam Etching
Other Dry Etching

Wet Processing

See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.

Thermal Processing

Packaging

Back-end Fabrication Tools

Die Singulation / Down-sizing

Other Packaging

Wafer/Die Bonding

Measurement & Characterization

Metrology, Electrical/Optical Testing and Thin-Film/Materials Characterization tools

Inspection

Microscopes 🔬
Electron Microscopes 🦠
Topology / Profilometer 🏔️

Thin-Film/Material Analysis

Optical 🔦
Electrical ⚡️
Other 🔍

Decomissioned Tools

Click the link above for a list of tools that are no longer available in the lab, but the data is retained for legacy purposes.